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Institution Date Title Author
國立交通大學 2019-04-02T05:58:38Z Resistive Switching Characteristics and Reliability of SiNx-Based Conductive Bridge Random Access Memory Lin, Chun-An; Dai, Guang-Jyun; Tseng, Tseung-Yuen
國立交通大學 2018-01-24T07:37:01Z 利用碲為源層及增強阻障特性於氮化矽金屬導電橋接電阻式記憶體之可靠度優化研究 戴光駿; 曾俊元; Dai, Guang-Jyun; Tseng, Tseung-Yuen

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