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國立臺灣大學 |
1998-01 |
Electronic and Atomic Structures of SiCN Thin Films by X-ray Absorption Spectroscopy and Theoretical Calculations
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Chang, Y. K.; Hsieh, H. H.; Pong, W. F.; Tsai, M.-H.; Lee, K. H.; Dann, D. E.; Chien, F. Z.; Tseng, P. K.; Tsang, K. L.; Su, W. K.; Chen, L. C.; Wei, S. L.; Chen, K. H.; Chen, Y. F.; Bhusari, D. M. |
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