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Showing items 1-5 of 5 (1 Page(s) Totally)
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| 臺大學術典藏 |
2019-07-24T08:47:24Z |
Critical angle for irreversible switching of the exchange-bias direction in (formula presented) films
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Schneider, C. M.;Schultz, L.;Schäfer, R.;YU-MING CHANG;de Haas, O.;Lin, M. T.; Lin, M. T.; Schafer, R.; Schultz, L.; Schneider, C. M. |
| 臺大學術典藏 |
2018-09-10T04:30:56Z |
Critical angle for irreversible switching of the exchange-bias direction in NiO-Cu-Ni81Fe19 films
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de Haas, O.;Schafer, R.;Schultz, L.;Schneider, C. M.;Chang, Y. M.;Lin, M. T.; de Haas, O.; Schafer, R.; Schultz, L.; Schneider, C. M.; Chang, Y. M.; Lin, M. T.; MINN-TSONG LIN |
| 臺大學術典藏 |
2018-09-10T04:30:56Z |
Critical angle for irreversible switching of the exchange-bias direction in NiO-Cu-Ni81Fe19 films
|
de Haas, O.;Schafer, R.;Schultz, L.;Schneider, C. M.;Chang, Y. M.;Lin, M. T.; de Haas, O.; Schafer, R.; Schultz, L.; Schneider, C. M.; Chang, Y. M.; Lin, M. T.; MINN-TSONG LIN |
| 臺大學術典藏 |
2002 |
Magnetic domain imaging of exchange bias system NiO/Cu/NiFe by Kerr microscopy
|
Chang, Y. M.;Lin, M. T.;Pan, W.;Ho, C. H.;Yao, Y. D.;de Haas, O.;Schafer, R.;Schneider, F. C. M.; Chang, Y. M.; Lin, M. T.; Pan, W.; Ho, C. H.; Yao, Y. D.; de Haas, O.; Schafer, R.; Schneider, F. C. M.; MINN-TSONG LIN |
| 臺大學術典藏 |
2002 |
Magnetic domain imaging of exchange bias system NiO/Cu/NiFe by Kerr microscopy
|
Chang, Y. M.;Lin, M. T.;Pan, W.;Ho, C. H.;Yao, Y. D.;de Haas, O.;Schafer, R.;Schneider, F. C. M.; Chang, Y. M.; Lin, M. T.; Pan, W.; Ho, C. H.; Yao, Y. D.; de Haas, O.; Schafer, R.; Schneider, F. C. M.; MINN-TSONG LIN |
Showing items 1-5 of 5 (1 Page(s) Totally)
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