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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
國立成功大學 2023-12 A deep learning-based pipeline for analyzing the influences of interfacial mechanochemical microenvironments on spheroid invasion using differential interference contrast microscopic images Ngo;Ngan, Thi Kim;Yang;Jue, Sze;Mao;Bin-Hsu;Nguyen;Mai, Thi Kim;Ng;Ding, Qi;Kuo;Yao-Lung;Tsai;Jui-Hung;Saw;Nee, Shier;Tu;Ting-Yuan
臺大學術典藏 2022-01-03T08:01:10Z A new EUV mask blank defect inspection method with coherent diffraction imaging Ding Qi; Kuen-Yu Tsai;  Jia-Han Li; JIA-HAN LI
臺大學術典藏 2018-09-10T15:26:03Z Design of an electron-optical system with a ball-tip emission source through a numerical optimization method for high-throughput electron-beam–direct-write lithography Yu-Tian Shen; Kuen-Yu Tsai; KUEN-YU TSAI; Hsuan-Ping Lee;Sheng-Yung Chen;Chun-Hung Liu;Ding-Qi;Yu-Tian Shen;Kuen-Yu Tsai; Hsuan-Ping Lee; Sheng-Yung Chen; Chun-Hung Liu; Ding-Qi
臺大學術典藏 2018-09-10T15:26:03Z Design of an electron-optical system with a ball-tip emission source through a numerical optimization method for high-throughput electron-beam–direct-write lithography Yu-Tian Shen; Kuen-Yu Tsai; KUEN-YU TSAI; Hsuan-Ping Lee;Sheng-Yung Chen;Chun-Hung Liu;Ding-Qi;Yu-Tian Shen;Kuen-Yu Tsai; Hsuan-Ping Lee; Sheng-Yung Chen; Chun-Hung Liu; Ding-Qi
臺大學術典藏 2018-09-10T15:00:24Z A New EUV Mask Blank Defect Inspection Method with Coherent Diffraction Imaging Ding Qi;Kuen-Yu Tsai;Jia-Han Li; Ding Qi; Kuen-Yu Tsai; Jia-Han Li; KUEN-YU TSAI
臺大學術典藏 2018-09-10T15:00:24Z A New EUV Mask Blank Defect Inspection Method with Coherent Diffraction Imaging Ding Qi;Kuen-Yu Tsai;Jia-Han Li; Ding Qi; Kuen-Yu Tsai; Jia-Han Li; KUEN-YU TSAI

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