|
English
|
正體中文
|
简体中文
|
Total items :2817890
|
|
Visitors :
27948150
Online Users :
370
Project Commissioned by the Ministry of Education
Project Executed by National Taiwan University Library
|
|
|
|
Taiwan Academic Institutional Repository >
Browse by Author
|
"ezhilvalavan s"
Showing items 1-10 of 10 (1 Page(s) Totally)
1
View [10|25|50] records per page
| 國立交通大學 |
2014-12-08T15:49:06Z |
Conduction mechanisms in amorphous and crystalline Ta2O5 thin films
|
Ezhilvalavan, S; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:46:52Z |
Electron paramagnetic resonance and luminescence study of sol-gel derived YAG : Cr powder
|
Lo, JR; Ezhilvalavan, S; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:46:52Z |
Electrical properties of rapid thermal-enhanced low pressure chemical vapor deposited Ta2O5 thin films
|
Lee, CJ; Huang, LT; Ezhilvalavan, S; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:46:51Z |
Preparation and properties of tantalum pentoxide (Ta2O5) thin films for ultra large scale integrated circuits (ULSIs) application - A review
|
Ezhilvalavan, S; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:46:46Z |
Short-duration rapid-thermal-annealing processing of tantalum oxide thin films
|
Ezhilvalavan, S; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:46:41Z |
Electrical properties of Ta2O5 thin films deposited on Ta
|
Ezhilvalavan, S; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:45:43Z |
Electrical properties of Ta2O5 thin films deposited on Cu
|
Ezhilvalavan, S; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:45:16Z |
Dielectric relaxation and defect analysis of Ta2O5 thin films
|
Ezhilvalavan, S; Tsai, MS; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:44:55Z |
Progress in the developments of (Ba,Sr)TiO3 (BST) thin films for Gigabit era DRAMs
|
Ezhilvalavan, S; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:27:13Z |
Properties and reliability of Ta2O5 thin films deposited on Ta
|
Ezhilvalavan, S; Tseng, TY |
Showing items 1-10 of 10 (1 Page(s) Totally)
1
View [10|25|50] records per page
|
