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Institution Date Title Author
國立高雄師範大學 2012 RF Stress Effects on CMOS LC-Loaded VCO Reliability Evaluated by Experiments Ruey-Lue Wang;H. D. Yen;J. S. Yuan;Y. Y. Zhang;G. W. Huang;W. K. Yeh;F. S. Huang; 王瑞祿
國立中山大學 2009 Application of Supercritical CO2 Fluid for Dielectric Improvement of SiOx Film C.T. Tsai;T.C. Chang;P.T. Liu;Y.L. Cheng;K.T. Kin;F.S. Huang
國立中山大學 2007 The suppression of Schottky leakage current in island-in amorphous silicon thin film transistors with the Cu/CuMg as source/drain metal M.C. Wang;T.C. Chang;P.T. Liu;R.W. Xiao;L.F. Lin;Y.Y. Li;F.S. Huang;J.R. Chen

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