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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
元智大學 Oct-20 Data-Driven Approach for Fault Detection and Diagnostic in Semiconductor Manufacturing Shu-Kai S. Fan; Chia-Yu Hsu; Du-Ming Tsai; Fei He; Chun-Chung Cheng
元智大學 May-22 Data Visualization of Anomaly Detection in Semiconductor Processing Tools Shu-Kai S. Fan; Du-Ming Tsai; Chih-Hung Jen; Chia-Yu Hsu; Fei He; Li-Ting Juan
元智大學 Jul-19 Key parameter identification and defective wafer detection of semiconductor manufacturing processes using image processing techniques Shu-Kai S. Fan; Du-Ming Tsai; Fei He; Jui-Yu Huang; Chih-Hung Jen

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