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"godwinraj d"
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國立成功大學 |
2023 |
The Impact of Hot Carrier Injection-Induced Device Degradation for Lower-Power FinFETs
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Chen, Y.-L.;Yeh, W.-K.;Hsu, Hsu H.-T.;Chen, K.-H.;Lien, D.-H.;Lin, W.-C.;Yu, T.-H.;Chiu, Y.-S.;Godwinraj, D.;Godfrey, D.;Wu, C.-H. |
Showing items 1-1 of 1 (1 Page(s) Totally) 1 View [10|25|50] records per page
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