| 臺大學術典藏 |
2020-12-11T03:03:10Z |
Parent-subsidiary linkage: How resource commitment and resource similarity influence firm performance
|
Chen, C.-J.;Lin, Y.-H.;Wang, S.-H.;Guo, R.-S.; Chen, C.-J.; Lin, Y.-H.; Wang, S.-H.; Guo, R.-S.; CHUNG-JEN CHEN; RUEY-SHAN GUO |
| 臺大學術典藏 |
2020-12-11T03:03:09Z |
Virtual vs physical platform: organizational capacity and slack, strategic decision and firm performance
|
Lee, H.;Hsiao, Y.-C.;Chen, C.-J.;Guo, R.-S.; Lee, H.; Hsiao, Y.-C.; Chen, C.-J.; Guo, R.-S.; CHUNG-JEN CHEN; RUEY-SHAN GUO |
| 臺大學術典藏 |
2020-06-11T06:41:08Z |
Connected vehicle safety science, system, and framework
|
Tsai, H.-M.; Hsieh, C.-H.; Lin, S.-D.; Wang, C.-C.; Yang, S.-W.; Chien, S.-Y.; Lee, C.-H.; Su, Y.-C.; Chou, C.-T.; Lee, Y.-J.; Pao, H.-K.; Guo, R.-S.; Chen, C.-J.; Yang, M.-H.; Chen, B.-Y.; Hung, Y.-P.; YI-PING HUNG; Chen, K.-W.;Tsai, H.-M.;Hsieh, C.-H.;Lin, S.-D.;Wang, C.-C.;Yang, S.-W.;Chien, S.-Y.;Lee, C.-H.;Su, Y.-C.;Chou, C.-T.;Lee, Y.-J.;Pao, H.-K.;Guo, R.-S.;Chen, C.-J.;Yang, M.-H.;Chen, B.-Y.;Hung, Y.-P.; Chen, K.-W. |
| 臺大學術典藏 |
2020-06-11T06:25:05Z |
Connected vehicle safety science, system, and framework
|
Chen, K.-W.;Tsai, H.-M.;Hsieh, C.-H.;Lin, S.-D.;Wang, C.-C.;Yang, S.-W.;Chien, S.-Y.;Lee, C.-H.;Su, Y.-C.;Chou, C.-T.;Lee, Y.-J.;Pao, H.-K.;Guo, R.-S.;Chen, C.-J.;Yang, M.-H.;Chen, B.-Y.;Hung, Y.-P.; Chen, K.-W.; Tsai, H.-M.; Hsieh, C.-H.; Lin, S.-D.; Wang, C.-C.; Yang, S.-W.; Chien, S.-Y.; Lee, C.-H.; Su, Y.-C.; Chou, C.-T.; Lee, Y.-J.; Pao, H.-K.; Guo, R.-S.; Chen, C.-J.; Yang, M.-H.; Chen, B.-Y.; Hung, Y.-P.; CHUN-TING CHOU |
| 臺大學術典藏 |
2020-06-11T06:24:49Z |
Connected vehicle safety science, system, and framework
|
Chen, K.-W.;Tsai, H.-M.;Hsieh, C.-H.;Lin, S.-D.;Wang, C.-C.;Yang, S.-W.;Chien, S.-Y.;Lee, C.-H.;Su, Y.-C.;Chou, C.-T.;Lee, Y.-J.;Pao, H.-K.;Guo, R.-S.;Chen, C.-J.;Yang, M.-H.;Chen, B.-Y.;Hung, Y.-P.; Chen, K.-W.; Tsai, H.-M.; Hsieh, C.-H.; Lin, S.-D.; Wang, C.-C.; Yang, S.-W.; Chien, S.-Y.; Lee, C.-H.; Su, Y.-C.; Chou, C.-T.; Lee, Y.-J.; Pao, H.-K.; Guo, R.-S.; Chen, C.-J.; Yang, M.-H.; Chen, B.-Y.; Hung, Y.-P.; CHUN-TING CHOU |
| 臺大學術典藏 |
2020-03-06T03:42:44Z |
The D-Day, V-Day, and bleak days of a disruptive technology: A new model for ex-ante evaluation of the timing of technology disruption
|
Chen C.;Zhang J.;Guo R.-S.; Chen C.; Zhang J.; Guo R.-S.; RUEY-SHAN GUO |
| 臺大學術典藏 |
2020-03-06T03:42:44Z |
Virtual fab: An enabling framework and dynamic manufacturing service provision mechanism
|
Su Y.-H.; Guo R.-S.; Chang S.-C.; RUEY-SHAN GUO |
| 臺大學術典藏 |
2020-03-06T03:42:43Z |
Run-to-run control schemes for CMP process subject to deterministic drifts
|
Guo R.-S.; Chen A.; Chen J.-J.; RUEY-SHAN GUO |
| 臺大學術典藏 |
2020-03-06T03:42:43Z |
SHEWMA: an end-of-line SPC scheme using wafer acceptance test data
|
Fan C.-M.; Guo R.-S.; Chang S.-C.; Wei C.-S.; RUEY-SHAN GUO |
| 臺大學術典藏 |
2020-03-06T03:42:43Z |
SHEWMAC: An end-of-line SPC scheme for joint monitoring of process mean and variance
|
Fan C.-M.; Chang S.-C.; Guo R.-S.; Kung H.-H.; You J.-C.; Chen H.-P.; Lin S.; Wei J.; RUEY-SHAN GUO |
| 臺大學術典藏 |
2020-03-06T03:42:43Z |
SHEWMAC: An end-of-line SPC scheme via exponentially weighted moving statistics
|
Fan C.-M.; Chang S.-C.; Guo R.-S.; Kung H.-H.; You J.-C.; Chen H.-P.; Lin S.; Wei C.-S.; RUEY-SHAN GUO |
| 臺大學術典藏 |
2020-03-06T03:42:43Z |
Supply chain inventory control in semiconductor manufacturing
|
Guo R.-S.;Chiang D.;Yang P.-C.; Guo R.-S.; Chiang D.; Yang P.-C.; RUEY-SHAN GUO |
| 臺大學術典藏 |
2020-03-06T03:42:42Z |
Partner selection model for design chain collaboration
|
Chen J.-Y.;Chiang D.M.-H.;Guo R.-S.; Chen J.-Y.; Chiang D.M.-H.; Guo R.-S.; RUEY-SHAN GUO |
| 臺大學術典藏 |
2020-03-06T03:42:42Z |
Process Control System for VLSI Fabrication
|
Sachs E.; Guo R.-S.; Ha S.; Hu A.; RUEY-SHAN GUO |
| 臺大學術典藏 |
2020-03-06T03:42:42Z |
Results of An Implant Masking Integrated Workcall in A Development Facility
|
Griffin R.;Guo R.-S.;Slama M.; Griffin R.; Guo R.-S.; Slama M.; RUEY-SHAN GUO |
| 臺大學術典藏 |
2020-03-06T03:42:42Z |
Retailer's optimal sourcing strategy by using one major supplier and one emergent supplier
|
Chiang D.M.;Guo R.-S.;Pai F.-Y.; Chiang D.M.; Guo R.-S.; Pai F.-Y.; RUEY-SHAN GUO |
| 臺大學術典藏 |
2020-03-06T03:42:42Z |
Run-To-run control of CMP process considering aging effects of pad and disc
|
Chen A.; Guo R.-S.; Chou Y.L.; Lin C.L.; Dun J.; Wu S.A.; RUEY-SHAN GUO |
| 臺大學術典藏 |
2020-03-06T03:42:41Z |
Modeling and optimization of wafer-level spatial uniformity with the use of rational subgrouping
|
Guo R.-S.;Chen A.;Liu C.;Lin A.;Lan M.; Guo R.-S.; Chen A.; Liu C.; Lin A.; Lan M.; RUEY-SHAN GUO |
| 臺大學術典藏 |
2020-03-06T03:42:41Z |
Multi-objectives exception management model for semiconductor back-end environment under turnkey service
|
Pai F.-Y.; RUEY-SHAN GUO; Guo R.-S.; Chiang D.M. |
| 臺大學術典藏 |
2020-03-06T03:42:41Z |
On-line process optimization and control using the sequential design of experiments
|
Sachs E.;Guo R.-S.;Ha S.;Hu A.; Sachs E.; Guo R.-S.; Ha S.; Hu A.; RUEY-SHAN GUO |
| 臺大學術典藏 |
2020-03-06T03:42:41Z |
Optimal pricing strategies under co-existence of price-takers and bargainers in a supply chain
|
Kuo C.-W.; Guo R.-S.; Wu Y.-F.; RUEY-SHAN GUO |
| 臺大學術典藏 |
2020-03-06T03:42:41Z |
Optimal supply chain configurations in semiconductor manufacturing
|
RUEY-SHAN GUO; Chen C.-B.; Cheng M.-T.; Chen A.; Guo R.-S.; Chiang D. |
| 臺大學術典藏 |
2020-03-06T03:42:41Z |
Modeling, Optimization and Control of Spatial Uniformity in Manufacturing Processes
|
Guo R.-S.; Guo R.-S.; RUEY-SHAN GUO |
| 臺大學術典藏 |
2020-03-06T03:42:40Z |
Forward echelon-based inventory monitoring in semiconductor supply chain
|
Guo R.-S.;Chiang D.;Lin H.-W.;Guo M.-S.; Guo R.-S.; Chiang D.; Lin H.-W.; Guo M.-S.; RUEY-SHAN GUO |
| 臺大學術典藏 |
2020-03-06T03:42:40Z |
Function-based cost modeling for wafer manufacturing and its application to strategic management
|
Guo R.-S.;Chen A.;Lin P.-L.;Shih Y.-C.; Guo R.-S.; Chen A.; Lin P.-L.; Shih Y.-C.; RUEY-SHAN GUO |
