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Showing items 56-65 of 88 (9 Page(s) Totally)
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| 臺大學術典藏 |
2020-03-06T03:40:44Z |
The D-Day, V-Day, and bleak days of a disruptive technology: A new model for ex-ante evaluation of the timing of technology disruption
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Chen, C.;Zhang, J.;Guo, R.-S.; Chen, C.; Zhang, J.; Guo, R.-S.; CHIA-LIN CHEN |
| 臺大學術典藏 |
2020-03-02T06:40:00Z |
Run-To-run control of CMP process considering aging effects of pad and disc
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Chen, A.; Guo, R.-S.; Chou, Y.L.; Lin, C.L.; Dun, J.; Wu, S.A.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:40:00Z |
A real-time equipment monitoring and fault detection system
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Guo, R.S.; Chen, A.; Tseng, C.L.; Fong, I.K.; Yang, A.; Lee, C.L.; Wu, C.H.; Lin, S.; Huang, S.J.; Lee, Y.C.; Chang, S.G.; Lee, M.Y.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:59Z |
A self-tuning run-by-run process controller for processes subject to random disturbances
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Guo, R.-S.; Chen, J.-J.; Chen, A.; Lu, S.-S.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:59Z |
Run-to-run control schemes for CMP process subject to deterministic drifts
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Guo, R.-S.; Chen, A.; Chen, J.-J.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:59Z |
An effective SPC approach to monitoring semiconductor quality data with multiple variation sources
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Chen, A.; Guo, R.-S.; Yeh, P.-C.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:59Z |
Function-based cost modeling for wafer manufacturing and its application to strategic management
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Guo, R.-S.; Chen, A.; Lin, P.-L.; Shih, Y.-C.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:59Z |
Modeling and optimization of wafer-level spatial uniformity with the use of rational subgrouping
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Guo, R.-S.; Chen, A.; Liu, C.; Lin, A.; Lan, M.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:58Z |
Age-based double EWMA controller and its application to a CMP process
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Chen, A.; Guo, R.-S.; ARGON CHEN |
| 臺大學術典藏 |
2020-03-02T06:39:58Z |
A quadratic goal programming model and sensitivity analysis for semiconductor supply chain
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Chiang, D.; Guo, R.-S.; Chen, A.; Chen, C.-B.; ARGON CHEN |
Showing items 56-65 of 88 (9 Page(s) Totally)
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