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Taiwan Academic Institutional Repository >
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"guo ruey shan"
Showing items 36-60 of 73 (3 Page(s) Totally)
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| 臺大學術典藏 |
2002 |
2002 deliverable report: forecasting methodologies for multidimensional aggregated demands
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Lan, Jakey; Chang, Shi-Chung; Chen, Kenk; Hsia, Ziv; Chen, Argon; Guo, Ruey-Shan; Chen, Argon; Guo, Ruey-Shan; Chang, Shi-Chung; Chen, Kenk; Hsia, Ziv; Lan, Jakey |
| 國立臺灣大學 |
2001-02 |
Age-Based Double EWMA Controller and Its Application to CMP Processes
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Chen, Argon; Guo, Ruey-Shan |
| 國立臺灣大學 |
2001 |
2001 deliverable report: intelligent multidimensional demand aggregation/disaggregation strategies
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Chang, Shi-Chung; Hsu, Chia-Hau; Cheng, Yee-Chiu; Chen, Argon; Guo, Ruey-Shan |
| 國立臺灣大學 |
2000-09 |
Realizing dynamic manufacturing service provisioning mechanism in order commitment service
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Chang, Shi-Chung; Guo, Ruey-Shan; Su, Yea-Huey; Lai, Yi-Chang |
| 臺大學術典藏 |
2000-09 |
Realizing dynamic manufacturing service provisioning mechanism in order commitment service
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Chang, Shi-Chung; Guo, Ruey-Shan; Su, Yea-Huey; Lai, Yi-Chang; Chang, Shi-Chung; Guo, Ruey-Shan; Su, Yea-Huey; Lai, Yi-Chang |
| 國立臺灣大學 |
2000-08 |
SHEWMA: an End-of-line SPC Scheme Using Wafer Acceptance Test Data
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Fan, Chih-Min; Guo, Ruey-Shan; Chang, Shi-Chung; Wei, Chih-Shih |
| 臺大學術典藏 |
2000-08 |
SHEWMA: an End-of-line SPC Scheme Using Wafer Acceptance Test Data
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Wei, Chih-Shih; Chang, Shi-Chung; Guo, Ruey-Shan; Fan, Chih-Min; Fan, Chih-Min; Guo, Ruey-Shan; Chang, Shi-Chung; Wei, Chih-Shih |
| 國立臺灣大學 |
2000-06 |
An effective SPC approach to monitoring semiconductor quality data with multiple variation sources
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Chen, Argon; Guo, Ruey-Shan; Yeh, Pei-Chen |
| 國立臺灣大學 |
2000-06 |
Run-to-run control schemes for CMP process subject to deterministic drifts
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Guo, Ruey-Shan; Chen, Argon; Chen, Jin-Jung |
| 國立臺灣大學 |
2000-06 |
Application of dynamic manufacturing service provisioning mechanism to delivery commitment
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Su, Yea-Huey; Chang, Shi-Chung; Guo, Ruey-Shan; Lai, Yi Chang |
| 國立臺灣大學 |
2000-06 |
SHEWMAC: an end-of-line SPC scheme via exponentially weighted moving statistics
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Fan, Chih-Min; Chang, Shi-Chung; Guo, Ruey-Shan; Kung, Hui-Hung; You, Jyh-Cheng; Chen, Hsin-Pai; Lin, Steven; Wei, Chih-Shih |
| 臺大學術典藏 |
2000-06 |
Run-to-run control schemes for CMP process subject to deterministic drifts
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Guo, Ruey-Shan; Chen, Argon; Chen, Jin-Jung; Guo, Ruey-Shan; Chen, Argon; Chen, Jin-Jung |
| 臺大學術典藏 |
2000-06 |
An effective SPC approach to monitoring semiconductor quality data with multiple variation sources
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Yeh, Pei-Chen; Chen, Argon; Guo, Ruey-Shan; Chen, Argon; Guo, Ruey-Shan; Yeh, Pei-Chen |
| 臺大學術典藏 |
2000 |
Application of dynamic manufacturing service provisioning mechanism to delivery commitment
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Su, Y.-H.; Chang, S.-C.; Guo, R.-S.; Lai, Y.C.; SHI-CHUNG CHANG; Guo, Ruey-Shan |
| 國立臺灣大學 |
1999-10 |
Run-to-run control of CMP process considering aging effects of pad and disc
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Chen, Argon; Guo, Ruey-Shan; Chou, Y.L.; Lin, C.L.; Dun, Jowei; Wu, S.A. |
| 國立臺灣大學 |
1999-10 |
Modeling and optimization of wafer-level spatial uniformity with the use of rational subgrouping
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Guo, Ruey-Shan; Chen, Argon; Liu, Cheewee; Lin, A.; Lan, M. |
| 國立臺灣大學 |
1999-10 |
Function-based cost modeling for wafer manufacturing and its application to strategic management
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Guo, Ruey-Shan; Chen, Argon; Lin, Pei-Lan; Shih, Yih-Cheng |
| 國立臺灣大學 |
1999-10 |
SHEWMAC: an end-of-line SPC scheme for joint monitoring of process mean and variance
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Fan, Chih-Min; Chang, Shi-Chung; Guo, Ruey-Shan; Kung, Hui-Hung; You, Jyh-Cheng; Chen, Hsin-Pai; Lin, Steven; Wei, John |
| 臺大學術典藏 |
1999-10 |
Modeling and optimization of wafer-level spatial uniformity with the use of rational subgrouping
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Guo, Ruey-Shan; Chen, Argon; Liu, Cheewee; Lin, A.; Lan, M.; Guo, Ruey-Shan; Chen, Argon; Liu, Cheewee; Lin, A.; Lan, M. |
| 臺大學術典藏 |
1999-10 |
Function-based cost modeling for wafer manufacturing and its application to strategic management
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Guo, Ruey-Shan; Chen, Argon; Lin, Pei-Lan; Shih, Yih-Cheng; Guo, Ruey-Shan; Chen, Argon; Lin, Pei-Lan; Shih, Yih-Cheng |
| 臺大學術典藏 |
1999-10 |
SHEWMAC: an end-of-line SPC scheme for joint monitoring of process mean and variance
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Fan, Chih-Min; Chang, Shi-Chung; Guo, Ruey-Shan; Kung, Hui-Hung; You, Jyh-Cheng; Chen, Hsin-Pai; Lin, Steven; Wei, John; Fan, Chih-Min; Chang, Shi-Chung; Guo, Ruey-Shan; Kung, Hui-Hung; You, Jyh-Cheng; Chen, Hsin-Pai; Lin, Steven; Wei, John |
| 國立臺灣大學 |
1998-06 |
Runs rules for bivariate Shewhart chart
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Chen, Argon; Guo, Ruey-Shan; Lee, Chun-Lin |
| 國立臺灣大學 |
1998-06 |
A conceptual framework for manufacturing service provisioning by virtual fabs
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Su, Yea-Huey; Guo, Ruey-Shan; Chang, Shi-Chung |
| 國立臺灣大學 |
1998-06 |
A dynamic binding model for service creation in virtual fab
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Chang, Shi-Chung; Chou, Tsung-Lian; Guo, Ruey-Shan; Su, Yea-Huey; Lu, Ling-Ling; Lai, I-Chang |
| 臺大學術典藏 |
1998-06 |
A dynamic binding model for service creation in virtual fab
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Chang, Shi-Chung; Chou, Tsung-Lian; Guo, Ruey-Shan; Su, Yea-Huey; Lu, Ling-Ling; Lai, I-Chang; Chang, Shi-Chung; Chou, Tsung-Lian; Guo, Ruey-Shan; Su, Yea-Huey; Lu, Ling-Ling; Lai, I-Chang |
Showing items 36-60 of 73 (3 Page(s) Totally)
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