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Taiwan Academic Institutional Repository >
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"guo ruey shan"
Showing items 56-73 of 73 (3 Page(s) Totally) << < 1 2 3 View [10|25|50] records per page
臺大學術典藏 |
1999-10 |
SHEWMAC: an end-of-line SPC scheme for joint monitoring of process mean and variance
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Fan, Chih-Min; Chang, Shi-Chung; Guo, Ruey-Shan; Kung, Hui-Hung; You, Jyh-Cheng; Chen, Hsin-Pai; Lin, Steven; Wei, John; Fan, Chih-Min; Chang, Shi-Chung; Guo, Ruey-Shan; Kung, Hui-Hung; You, Jyh-Cheng; Chen, Hsin-Pai; Lin, Steven; Wei, John |
國立臺灣大學 |
1998-06 |
Runs rules for bivariate Shewhart chart
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Chen, Argon; Guo, Ruey-Shan; Lee, Chun-Lin |
國立臺灣大學 |
1998-06 |
A conceptual framework for manufacturing service provisioning by virtual fabs
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Su, Yea-Huey; Guo, Ruey-Shan; Chang, Shi-Chung |
國立臺灣大學 |
1998-06 |
A dynamic binding model for service creation in virtual fab
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Chang, Shi-Chung; Chou, Tsung-Lian; Guo, Ruey-Shan; Su, Yea-Huey; Lu, Ling-Ling; Lai, I-Chang |
臺大學術典藏 |
1998-06 |
A dynamic binding model for service creation in virtual fab
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Chang, Shi-Chung; Chou, Tsung-Lian; Guo, Ruey-Shan; Su, Yea-Huey; Lu, Ling-Ling; Lai, I-Chang; Chang, Shi-Chung; Chou, Tsung-Lian; Guo, Ruey-Shan; Su, Yea-Huey; Lu, Ling-Ling; Lai, I-Chang |
臺大學術典藏 |
1998-06 |
A conceptual framework for manufacturing service provisioning by virtual fabs
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Su, Yea-Huey; Guo, Ruey-Shan; Chang, Shi-Chung; Su, Yea-Huey; Guo, Ruey-Shan; Chang, Shi-Chung |
國立臺灣大學 |
1998 |
An Integrated Approach to Semiconductor Equipment Monitoring
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Chen, Argon; Guo, Ruey-Shan; Yang, Alex; Tseng, Chwan-Lu |
國立臺灣大學 |
1997-10 |
A cost-effective methodology for a run-by-run EWMA controller
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Guo, Ruey-Shan; Huang, Li-Shia; Chen, Argon; Chen, Jin-Jung |
國立臺灣大學 |
1997-06 |
EWMA/SD: an end-of-line SPC scheme to monitor sequence-disordered data [semiconductor manufacturing]
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Fan, Chih-Min; Guo, Ruey-Shan; Chang, Shi-Chung |
國立臺灣大學 |
1996-11 |
Abnormal trend detection of sequence-disordered data using EWMA method [wafer fabrication]
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Fan, Jr-Min; Guo, Ruey-Shan; Chang, Shi-Chung; Lee, Jian-Huei |
臺大學術典藏 |
1996-11 |
Abnormal trend detection of sequence-disordered data using EWMA method [wafer fabrication]
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Fan, Jr-Min; Guo, Ruey-Shan; Chang, Shi-Chung; Lee, Jian-Huei; Fan, Jr-Min; Guo, Ruey-Shan; Chang, Shi-Chung; Lee, Jian-Huei |
國立臺灣大學 |
1996-10 |
Intelligent process diagnosis based on end-of-line electrical test data
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Guo, Ruey-Shan; Tsai, Cheng-Kai; Lee, Jian-Huei; Chang, Shi-Chung |
國立臺灣大學 |
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Intelligent Demand Aggregation and Forecasting
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Chen, Argon; Guo, Ruey-Shan; Chang, Shi-Chung; Blue, Jakey; Chang, Felix; Chen, Ken; Hsia, Ziv; Hsie, B.W.; Lin, Peggy |
國立臺灣大學 |
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Intelligent Demand Aggregation and Forecasting
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Chen, Argon; Guo, Ruey-Shan; Chang, Shi-Chung; Blue, Jakey; Chang, Felix; Chen, Ken; Hsia, Ziv; Hsie, B.W.; Lin, Peggy |
國立臺灣大學 |
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Task 879.1: Intelligent Demand Aggregation and Forecasting
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Chen, Argon; Guo, Ruey-Shan; Chang, Shi-Chung |
國立臺灣大學 |
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Intelligent Demand Aggregation and Forecasting
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Chen, Argon; Guo, Ruey-Shan; Chang, Shi-Chung; Blue, Jakey; Chang, Felix; Chen, Ken; Hsia, Ziv; Hsie, B.W.; Lin, Peggy |
國立臺灣大學 |
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Intelligent Demand Aggregation and Forecasting
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Chen, Argon; Guo, Ruey-Shan; Chang, Shi-Chung; Blue, Jakey; Chang, Felix; Chen, Ken; Hsia, Ziv; Hsie, B.W.; Lin, Peggy |
國立臺灣大學 |
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Robust Configuration and Monitoring of Semiconductor Supply Chain
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Chen, Argon; Chiang, David; Guo, Ruey-Shan |
Showing items 56-73 of 73 (3 Page(s) Totally) << < 1 2 3 View [10|25|50] records per page
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