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Showing items 21-45 of 73 (3 Page(s) Totally)
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| 臺大學術典藏 |
2006-02 |
A WIP-based Exception Management Model for Integrated Circuit Back-end Production Processes
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Guo, Ruey-Shan; Chiang, David M.; Pai, Fan-Yun; Guo, Ruey-Shan; Chiang, David M.; Pai, Fan-Yun |
| 國立臺灣大學 |
2005-01 |
Virtual Fab: Enabling Framework and Dynamic Manufacturing Service Provisioning Mechanism
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Su, Yea-Huey; Guo, Ruey-Shan; Chang, Shi-Chung |
| 國立臺灣大學 |
2005 |
2005 deliverable report: supply chain quadratic goal programming
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Chen, Argon; Chiang, David; Guo, Ruey-Shan; Cheng, M.C.; Chang, B.C.; Chen, C.B.; Lan, Jakey; Hong, Amos |
| 國立臺灣大學 |
2005 |
Virtual fab: an enabling framework and dynamic manufacturing service provision mechanism
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Su, Yea-Huey; Guo, Ruey-Shan; Chang, Shi-Chung |
| 臺大學術典藏 |
2005 |
2005 deliverable report: supply chain quadratic goal programming
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Hong, Amos; Lan, Jakey; Chen, C.B.; Chang, B.C.; Cheng, M.C.; Chen, Argon; Chiang, David; Guo, Ruey-Shan; Cheng, M.C.; Chang, B.C.; Chen, C.B.; Lan, Jakey; Hong, Amos; Chen, Argon; Chiang, David; Guo, Ruey-Shan |
| 臺大學術典藏 |
2005 |
Virtual fab: an enabling framework and dynamic manufacturing service provision mechanism
|
Su, Yea-Huey; Guo, Ruey-Shan; Chang, Shi-Chung; Su, Yea-Huey; Guo, Ruey-Shan; Chang, Shi-Chung |
| 國立臺灣大學 |
2003-10 |
Integrated yield-mining solution with enhanced electrical test data correlation
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Fan, Chih-Min; Guo, Ruey-Shan; Chen, Argon; Hon, Amos; Wei, John; King, Mingchu |
| 臺大學術典藏 |
2003-10 |
Integrated yield-mining solution with enhanced electrical test data correlation
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King, Mingchu; Hon, Amos; Wei, John; Chen, Argon; Guo, Ruey-Shan; Fan, Chih-Min; Fan, Chih-Min; Guo, Ruey-Shan; Chen, Argon; Hon, Amos; Wei, John; King, Mingchu |
| 國立臺灣大學 |
2003-03 |
Intelligent Demand Aggregation and Forecasting
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Chen, Argon; Guo, Ruey-Shan; Chang, Shi-Chung; Cheng, Janet; Ho, Odey; Fu, Legend; Huang, Tony; Yang, Kyle |
| 國立臺灣大學 |
2003-03 |
Intelligent Demand Aggregation and Forecasting
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Chen, Argon; Guo, Ruey-Shan; Chang, Shi-Chung; Cheng, Janet; Ho, Odey; Fu, Legend; Huang, Tony; Yang, Kyle |
| 國立臺灣大學 |
2003-03 |
Intelligent Demand Aggregation and Forecasting
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Chen, Argon; Guo, Ruey-Shan; Chang, Shi-Chung; Ho, Odey; Fu, Legend; Huang, Tony; Tseng, Janet; Yang, Kyle |
| 國立臺灣大學 |
2003 |
2003 deliverable report: forecasting methodologies for multidimensional aggregated demands
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Chen, Argon; Guo, Ruey-Shan; Chang, Shi-Chung; Huang, Tonny; Yang, Kyle; Tzeng, Janet |
| 臺大學術典藏 |
2003 |
2003 deliverable report: forecasting methodologies for multidimensional aggregated demands
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Tzeng, Janet; Yang, Kyle; Huang, Tonny; Chen, Argon; Guo, Ruey-Shan; Chang, Shi-Chung; Huang, Tonny; Yang, Kyle; Tzeng, Janet; Chen, Argon; Guo, Ruey-Shan; Chang, Shi-Chung |
| 國立臺灣大學 |
2002-06 |
An EWMA-Based Process Mean Estimator with Dynamic Tuning Capability
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Guo, Ruey-Shan; Chen, Jin-Jung |
| 國立臺灣大學 |
2002 |
2002 deliverable report: forecasting methodologies for multidimensional aggregated demands
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Chen, Argon; Guo, Ruey-Shan; Chang, Shi-Chung; Chen, Kenk; Hsia, Ziv; Lan, Jakey |
| 臺大學術典藏 |
2002 |
2002 deliverable report: forecasting methodologies for multidimensional aggregated demands
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Lan, Jakey; Chang, Shi-Chung; Chen, Kenk; Hsia, Ziv; Chen, Argon; Guo, Ruey-Shan; Chen, Argon; Guo, Ruey-Shan; Chang, Shi-Chung; Chen, Kenk; Hsia, Ziv; Lan, Jakey |
| 國立臺灣大學 |
2001-02 |
Age-Based Double EWMA Controller and Its Application to CMP Processes
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Chen, Argon; Guo, Ruey-Shan |
| 國立臺灣大學 |
2001 |
2001 deliverable report: intelligent multidimensional demand aggregation/disaggregation strategies
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Chang, Shi-Chung; Hsu, Chia-Hau; Cheng, Yee-Chiu; Chen, Argon; Guo, Ruey-Shan |
| 國立臺灣大學 |
2000-09 |
Realizing dynamic manufacturing service provisioning mechanism in order commitment service
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Chang, Shi-Chung; Guo, Ruey-Shan; Su, Yea-Huey; Lai, Yi-Chang |
| 臺大學術典藏 |
2000-09 |
Realizing dynamic manufacturing service provisioning mechanism in order commitment service
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Chang, Shi-Chung; Guo, Ruey-Shan; Su, Yea-Huey; Lai, Yi-Chang; Chang, Shi-Chung; Guo, Ruey-Shan; Su, Yea-Huey; Lai, Yi-Chang |
| 國立臺灣大學 |
2000-08 |
SHEWMA: an End-of-line SPC Scheme Using Wafer Acceptance Test Data
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Fan, Chih-Min; Guo, Ruey-Shan; Chang, Shi-Chung; Wei, Chih-Shih |
| 臺大學術典藏 |
2000-08 |
SHEWMA: an End-of-line SPC Scheme Using Wafer Acceptance Test Data
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Wei, Chih-Shih; Chang, Shi-Chung; Guo, Ruey-Shan; Fan, Chih-Min; Fan, Chih-Min; Guo, Ruey-Shan; Chang, Shi-Chung; Wei, Chih-Shih |
| 國立臺灣大學 |
2000-06 |
An effective SPC approach to monitoring semiconductor quality data with multiple variation sources
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Chen, Argon; Guo, Ruey-Shan; Yeh, Pei-Chen |
| 國立臺灣大學 |
2000-06 |
Run-to-run control schemes for CMP process subject to deterministic drifts
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Guo, Ruey-Shan; Chen, Argon; Chen, Jin-Jung |
| 國立臺灣大學 |
2000-06 |
Application of dynamic manufacturing service provisioning mechanism to delivery commitment
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Su, Yea-Huey; Chang, Shi-Chung; Guo, Ruey-Shan; Lai, Yi Chang |
Showing items 21-45 of 73 (3 Page(s) Totally)
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