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Showing items 41-65 of 73 (3 Page(s) Totally)
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| 國立臺灣大學 |
2000-08 |
SHEWMA: an End-of-line SPC Scheme Using Wafer Acceptance Test Data
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Fan, Chih-Min; Guo, Ruey-Shan; Chang, Shi-Chung; Wei, Chih-Shih |
| 臺大學術典藏 |
2000-08 |
SHEWMA: an End-of-line SPC Scheme Using Wafer Acceptance Test Data
|
Wei, Chih-Shih; Chang, Shi-Chung; Guo, Ruey-Shan; Fan, Chih-Min; Fan, Chih-Min; Guo, Ruey-Shan; Chang, Shi-Chung; Wei, Chih-Shih |
| 國立臺灣大學 |
2000-06 |
An effective SPC approach to monitoring semiconductor quality data with multiple variation sources
|
Chen, Argon; Guo, Ruey-Shan; Yeh, Pei-Chen |
| 國立臺灣大學 |
2000-06 |
Run-to-run control schemes for CMP process subject to deterministic drifts
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Guo, Ruey-Shan; Chen, Argon; Chen, Jin-Jung |
| 國立臺灣大學 |
2000-06 |
Application of dynamic manufacturing service provisioning mechanism to delivery commitment
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Su, Yea-Huey; Chang, Shi-Chung; Guo, Ruey-Shan; Lai, Yi Chang |
| 國立臺灣大學 |
2000-06 |
SHEWMAC: an end-of-line SPC scheme via exponentially weighted moving statistics
|
Fan, Chih-Min; Chang, Shi-Chung; Guo, Ruey-Shan; Kung, Hui-Hung; You, Jyh-Cheng; Chen, Hsin-Pai; Lin, Steven; Wei, Chih-Shih |
| 臺大學術典藏 |
2000-06 |
Run-to-run control schemes for CMP process subject to deterministic drifts
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Guo, Ruey-Shan; Chen, Argon; Chen, Jin-Jung; Guo, Ruey-Shan; Chen, Argon; Chen, Jin-Jung |
| 臺大學術典藏 |
2000-06 |
An effective SPC approach to monitoring semiconductor quality data with multiple variation sources
|
Yeh, Pei-Chen; Chen, Argon; Guo, Ruey-Shan; Chen, Argon; Guo, Ruey-Shan; Yeh, Pei-Chen |
| 臺大學術典藏 |
2000 |
Application of dynamic manufacturing service provisioning mechanism to delivery commitment
|
Su, Y.-H.; Chang, S.-C.; Guo, R.-S.; Lai, Y.C.; SHI-CHUNG CHANG; Guo, Ruey-Shan |
| 國立臺灣大學 |
1999-10 |
Run-to-run control of CMP process considering aging effects of pad and disc
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Chen, Argon; Guo, Ruey-Shan; Chou, Y.L.; Lin, C.L.; Dun, Jowei; Wu, S.A. |
| 國立臺灣大學 |
1999-10 |
Modeling and optimization of wafer-level spatial uniformity with the use of rational subgrouping
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Guo, Ruey-Shan; Chen, Argon; Liu, Cheewee; Lin, A.; Lan, M. |
| 國立臺灣大學 |
1999-10 |
Function-based cost modeling for wafer manufacturing and its application to strategic management
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Guo, Ruey-Shan; Chen, Argon; Lin, Pei-Lan; Shih, Yih-Cheng |
| 國立臺灣大學 |
1999-10 |
SHEWMAC: an end-of-line SPC scheme for joint monitoring of process mean and variance
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Fan, Chih-Min; Chang, Shi-Chung; Guo, Ruey-Shan; Kung, Hui-Hung; You, Jyh-Cheng; Chen, Hsin-Pai; Lin, Steven; Wei, John |
| 臺大學術典藏 |
1999-10 |
Modeling and optimization of wafer-level spatial uniformity with the use of rational subgrouping
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Guo, Ruey-Shan; Chen, Argon; Liu, Cheewee; Lin, A.; Lan, M.; Guo, Ruey-Shan; Chen, Argon; Liu, Cheewee; Lin, A.; Lan, M. |
| 臺大學術典藏 |
1999-10 |
Function-based cost modeling for wafer manufacturing and its application to strategic management
|
Guo, Ruey-Shan; Chen, Argon; Lin, Pei-Lan; Shih, Yih-Cheng; Guo, Ruey-Shan; Chen, Argon; Lin, Pei-Lan; Shih, Yih-Cheng |
| 臺大學術典藏 |
1999-10 |
SHEWMAC: an end-of-line SPC scheme for joint monitoring of process mean and variance
|
Fan, Chih-Min; Chang, Shi-Chung; Guo, Ruey-Shan; Kung, Hui-Hung; You, Jyh-Cheng; Chen, Hsin-Pai; Lin, Steven; Wei, John; Fan, Chih-Min; Chang, Shi-Chung; Guo, Ruey-Shan; Kung, Hui-Hung; You, Jyh-Cheng; Chen, Hsin-Pai; Lin, Steven; Wei, John |
| 國立臺灣大學 |
1998-06 |
Runs rules for bivariate Shewhart chart
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Chen, Argon; Guo, Ruey-Shan; Lee, Chun-Lin |
| 國立臺灣大學 |
1998-06 |
A conceptual framework for manufacturing service provisioning by virtual fabs
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Su, Yea-Huey; Guo, Ruey-Shan; Chang, Shi-Chung |
| 國立臺灣大學 |
1998-06 |
A dynamic binding model for service creation in virtual fab
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Chang, Shi-Chung; Chou, Tsung-Lian; Guo, Ruey-Shan; Su, Yea-Huey; Lu, Ling-Ling; Lai, I-Chang |
| 臺大學術典藏 |
1998-06 |
A dynamic binding model for service creation in virtual fab
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Chang, Shi-Chung; Chou, Tsung-Lian; Guo, Ruey-Shan; Su, Yea-Huey; Lu, Ling-Ling; Lai, I-Chang; Chang, Shi-Chung; Chou, Tsung-Lian; Guo, Ruey-Shan; Su, Yea-Huey; Lu, Ling-Ling; Lai, I-Chang |
| 臺大學術典藏 |
1998-06 |
A conceptual framework for manufacturing service provisioning by virtual fabs
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Su, Yea-Huey; Guo, Ruey-Shan; Chang, Shi-Chung; Su, Yea-Huey; Guo, Ruey-Shan; Chang, Shi-Chung |
| 國立臺灣大學 |
1998 |
An Integrated Approach to Semiconductor Equipment Monitoring
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Chen, Argon; Guo, Ruey-Shan; Yang, Alex; Tseng, Chwan-Lu |
| 國立臺灣大學 |
1997-10 |
A cost-effective methodology for a run-by-run EWMA controller
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Guo, Ruey-Shan; Huang, Li-Shia; Chen, Argon; Chen, Jin-Jung |
| 國立臺灣大學 |
1997-06 |
EWMA/SD: an end-of-line SPC scheme to monitor sequence-disordered data [semiconductor manufacturing]
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Fan, Chih-Min; Guo, Ruey-Shan; Chang, Shi-Chung |
| 國立臺灣大學 |
1996-11 |
Abnormal trend detection of sequence-disordered data using EWMA method [wafer fabrication]
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Fan, Jr-Min; Guo, Ruey-Shan; Chang, Shi-Chung; Lee, Jian-Huei |
Showing items 41-65 of 73 (3 Page(s) Totally)
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