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Showing items 66-73 of 73 (3 Page(s) Totally)
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| 臺大學術典藏 |
1996-11 |
Abnormal trend detection of sequence-disordered data using EWMA method [wafer fabrication]
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Fan, Jr-Min; Guo, Ruey-Shan; Chang, Shi-Chung; Lee, Jian-Huei; Fan, Jr-Min; Guo, Ruey-Shan; Chang, Shi-Chung; Lee, Jian-Huei |
| 國立臺灣大學 |
1996-10 |
Intelligent process diagnosis based on end-of-line electrical test data
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Guo, Ruey-Shan; Tsai, Cheng-Kai; Lee, Jian-Huei; Chang, Shi-Chung |
| 國立臺灣大學 |
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Intelligent Demand Aggregation and Forecasting
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Chen, Argon; Guo, Ruey-Shan; Chang, Shi-Chung; Blue, Jakey; Chang, Felix; Chen, Ken; Hsia, Ziv; Hsie, B.W.; Lin, Peggy |
| 國立臺灣大學 |
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Intelligent Demand Aggregation and Forecasting
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Chen, Argon; Guo, Ruey-Shan; Chang, Shi-Chung; Blue, Jakey; Chang, Felix; Chen, Ken; Hsia, Ziv; Hsie, B.W.; Lin, Peggy |
| 國立臺灣大學 |
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Task 879.1: Intelligent Demand Aggregation and Forecasting
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Chen, Argon; Guo, Ruey-Shan; Chang, Shi-Chung |
| 國立臺灣大學 |
|
Intelligent Demand Aggregation and Forecasting
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Chen, Argon; Guo, Ruey-Shan; Chang, Shi-Chung; Blue, Jakey; Chang, Felix; Chen, Ken; Hsia, Ziv; Hsie, B.W.; Lin, Peggy |
| 國立臺灣大學 |
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Intelligent Demand Aggregation and Forecasting
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Chen, Argon; Guo, Ruey-Shan; Chang, Shi-Chung; Blue, Jakey; Chang, Felix; Chen, Ken; Hsia, Ziv; Hsie, B.W.; Lin, Peggy |
| 國立臺灣大學 |
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Robust Configuration and Monitoring of Semiconductor Supply Chain
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Chen, Argon; Chiang, David; Guo, Ruey-Shan |
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