English  |  正體中文  |  简体中文  |  2827024  
???header.visitor??? :  32079318    ???header.onlineuser??? :  1200
???header.sponsordeclaration???
 		 
???search.scope??? ???search.advance???
臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
???ui.leftmenu.abouttair???
???ui.leftmenu.explanation???

???ui.leftmenu.bartitle???
Repositories
Author
Title
Date
???ui.leftmenu.statisticschart???
???ui.leftmenu.realtimefacts???
???ui.leftmenu.trend???

???index.news???
2019臺灣學術機構典藏
研討會
機構典藏系統RC7版本已
發佈

???ui.leftmenu.copyrighttitle???
???ui.leftmenu.copyrightpublisher???
???ui.leftmenu.copyrightconference???

???ui.leftmenu.link???
機構典藏計畫網站
ROAR
OpenDOAR
SHERPA
OAIster
JAIRO
Ira
DSPACE
RWWR
臺大學術典藏NTU Scholars
???tair.name??? >  ???browser.page.title.author???

"h m chu"???jsp.browse.items-by-author.description???

???jsp.browse.items-by-author.back???
???jsp.browse.items-by-author.order1??? ???jsp.browse.items-by-author.order2???

Showing items 1-6 of 6  (1 Page(s) Totally)
1 
View [10|25|50] records per page

Institution Date Title Author
國立中山大學 2006 Inverse Approach for Estimating Rheological Characteristics of Adsorption Layer in Thin Film EHL Contacts H.M. Chu; R.T. Lee; Y.C. Chiou
國立中山大學 2005 Rheological characteristics for thin film elastohydrodynamic lubrication H.M. Chu; R.T. Lee; S.Y. Hu ; Y.P. Chang
國立中山大學 2004 Inverse approach for calculating pressure and viscosity in pure squeeze EHL motion of circular contacts H.M. Chu;R.T. Lee; Y.C. Chiou
國立中山大學 2004 Study on Pure Squeeze Lastohydrodynamic Lubrication Motion Using Optical Interferometry and the Inverse Approach H.M. Chu; R.T. Lee; Y.C. Chiou
國立中山大學 2003 Inverse approach for estimating pressure and viscosity in elastohydrodynamic lubrication of circular contacts R.T. Lee; H.M. Chu; Y.C. Chiou
國立中山大學 2002 Inverse approximation for calculating pressure distribution in elastohydrodynamic lubrication R.T. Lee; H.M. Chu; Y.C. Chiou

Showing items 1-6 of 6  (1 Page(s) Totally)
1 
View [10|25|50] records per page

DSpace Software Copyright © 2002-2004  MIT   &  Hewlett-Packard   /   Enhanced by   NTU Library IR team