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Institution Date Title Author
國立臺灣大學 2003 Critical angle for irreversible switching of the exchange-bias direction in NiO-Cu-Ni81Fe19 films Haas, O. de; Sch?fer, R.; Schultz, L.; Schneider, C. M.; Chang, Y. M.; Lin, M.-T.
國立臺灣大學 2002 Magnetic domain imaging of exchange bias system NiO/Cu/NiFe by Kerr microscopy Chang, Y. M.; Lin, Minn-Tsong; Pan, W.; Ho, C. H.; Yao, Y. D.; Haas, O. de; Sch?fer, R.; Schneider, C. M.

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