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| 國立臺灣大學 |
1991 |
Analytical Imaging with a Scanning Ion Microprobe
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王玉麟; Levi-Setti, R.; Chabala, J. M.; Hallegot, P.; Girod-Hallegot, C.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.; Hallegot, P.; Girod-Hallegot, C. |
| 國立臺灣大學 |
1989 |
Secondary Ion Imaging Microanalysis
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王玉麟; Levi-Setti, R.; Chabala, J. M.; Girod, C.; Hallegot, P.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.; Girod, C.; Hallegot, P. |
| 國立臺灣大學 |
1989 |
The Use of Focused Heavy-Ion Beams for Submicrometer Imaging Microanalysis
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王玉麟; Levi-Setti, R.; Chabala, J. M.; Girod, C.; Hallegot, P.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.; Girod, C.; Hallegot, P. |
| 國立臺灣大學 |
1989 |
Chemical Characterization of Electronic Microstructures with Sub-100 nm Lateral Resolution
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王玉麟; Levi-Setti, R.; Chabala, J. M.; Hallegot, P.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.; Hallegot, P. |
| 國立臺灣大學 |
1988 |
Chemical Characterization of Electronic Microstructures with Sub-100 nm Lateral Resolution
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王玉麟; Levi-Setti, R.; Chabala, J. M.; Hallegot, P.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.; Hallegot, P. |
| 國立臺灣大學 |
1988 |
High Resolution Ion Probe Imaging and Analysis
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王玉麟; Levi-Setti, R.; Chabala, J. M.; Hallegot, P.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.; Hallegot, P. |
Showing items 1-6 of 6 (1 Page(s) Totally)
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