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Showing items 1-9 of 9 (1 Page(s) Totally)
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| 國立交通大學 |
2019-04-03T06:47:44Z |
Determining thickness of films on a curved substrate by use of ellipsometric measurement
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Han, Chien-Yuan; Lee, Zhen-You; Chao, Yu-Faye |
| 國立交通大學 |
2019-04-03T06:47:30Z |
Developing a Phase and Intensity Measurement Technique with Multiple Incident Angles under Surface Plasmon Resonance Condition
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Han, Chien-Yuan; You, Du Cheng; Chen, Yi-Ren; Chao, Yu-Faye |
| 國立交通大學 |
2019-04-03T06:37:53Z |
Generating Radially and Azimuthally Polarized Beams by Using a Pair of Lateral Displacement Beamsplitters
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Han, Chien-Yuan; Wei, Zhi-Hao; Hsu, Yung; Chen, Kun-Huang; Yeh, Chien-Hung; Wu, Wei-Xuan; Chen, Jing-Heng |
| 國立交通大學 |
2019-04-02T05:59:31Z |
Prism-hologram-prism sandwiched recording method for polarization-selective substrate-mode volume holograms with a large diffraction angle
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Hsu, Fan-Hsi; Han, Chien-Yuan; Chen, Kun-Huang; Hsu, Ken-Yuh; Chen, Jing-Heng |
| 國立交通大學 |
2014-12-08T15:37:38Z |
Assessment of interface roughness during plasma etching through the use of real-time ellipsometry
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Han, Chien-Yuan; Lai, Chien-Wen; Chao, Yu-Faye; Leou, Ke-Ciang; Lin, Tsang-Lang |
| 國立交通大學 |
2014-12-08T15:14:40Z |
Post flight analysis of the surface plasmon resonance enhanced photoelastic modulated ellipsometry
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Chao, Yu-Faye; Han, Chien-Yuan |
| 國立交通大學 |
2014-12-08T15:09:20Z |
Determining thickness of films on a curved substrate by use of ellipsometric measurements
|
Han, Chien-Yuan; Lee, Zhen-You; Chao, Yu-Faye |
| 國立聯合大學 |
2009 |
Simple Triangular Path Interferometer for Generation of an Inhomogeneously Polarized Beam
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Han, Chien-Yuan; Ho, Chien-Wa; Kuo, Chih-Wei; Chang, Ruey-Shyan |
| 國立聯合大學 |
2008 |
Determining thickness of films on a curved substrate by use of ellipsometric measurement
|
Han, Chien-Yuan; Lee, Zhen-You; Chao, Yu-Faye |
Showing items 1-9 of 9 (1 Page(s) Totally)
1
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