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"han ming hung"的相关文件
显示项目 1-25 / 25 (共1页)
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| 國立交通大學 |
2019-04-02T05:58:41Z |
Low-Voltage Programmable Gate-All-Around (GAA) Nanosheet TFT Nonvolatile Memory Using Band-to-Band Tunneling Induced Hot Electron (BBHE) Method
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Chen, Lun-Chun; Chen, Hung-Bin; Chang, Yu-Shuo; Lin, Shih-Han; Han, Ming-Hung; Wu, Jia-Jiun; Yeh, Mu-Shin; Lin, Yu-Ru; Wu, Yung-Chun |
| 國立交通大學 |
2017-04-21T06:49:39Z |
3D 65nm CMOS with 320 degrees C Microwave Dopant Activation
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Lee, Yao-Jen; Lu, Yu-Lun; Hsueh, Fu-Kuo; Huang, Kuo-Chin; Wan, Chia-Chen; Cheng, Tz-Yen; Han, Ming-Hung; Kowalski, Jeff M.; Kowalski, Jeff E.; Heh, Dawei; Chuang, Hsi-Ta; Li, Yiming; Chao, Tien-Sheng; Wu, Ching-Yi; Yang, Fu-Liang |
| 國立交通大學 |
2015-11-26T01:05:53Z |
隨機金屬閘極功函數導致之16奈米金氧半場效應電晶體元件及電路特性擾動之研究
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韓銘鴻; Han, Ming-Hung; 李義明; Li, Yiming |
| 國立交通大學 |
2014-12-12T02:36:50Z |
多重閘極無接面金氧半場效應電晶體之物理，元件操作，及電路應用之研究
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韓銘鴻; Han, Ming-Hung; 張俊彥; Chang, Chun-Yen |
| 國立交通大學 |
2014-12-08T15:47:47Z |
Statistical Simulation of Static Noise Margin Variability in Static Random Access Memory
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Li, Yiming; Cheng, Hui-Wen; Han, Ming-Hung |
| 國立交通大學 |
2014-12-08T15:39:18Z |
3D Device Simulation of Work Function and Interface Trap Fluctuations on High-kappa/Metal Gate Devices
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Cheng, Hui-Wen; Li, Fu-Hai; Han, Ming-Hung; Yiu, Chun-Yen; Yu, Chia-Hui; Lee, Kuo-Fu; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:38:10Z |
Quantum hydrodynamic simulation of discrete-dopant fluctuated physical quantities in nanoscale FinFET
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Li, Yiming; Cheng, Hui-Wen; Han, Ming-Hung |
| 國立交通大學 |
2014-12-08T15:36:49Z |
Effect of the Circle-Grid Electrodes on Concentrated GaAs Solar Cell Efficiency
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Chung, Chen-Chen; Binh Tinh Tran; Han, Ming-Hung; Lin, Kung-Liang; Yu, Hung-Wei; Ho, Yen-Teng; Chang, Chun-Yen; Chang, Edward Yi |
| 國立交通大學 |
2014-12-08T15:36:43Z |
Temperature dependence of electronic behaviors in quantum dimension junctionless thin-film transistor
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Cheng, Ya-Chi; Chen, Hung-Bin; Han, Ming-Hung; Lu, Nan-Heng; Su, Jun-Ji; Shao, Chi-Shen; Wu, Yung-Chun |
| 國立交通大學 |
2014-12-08T15:36:06Z |
Statistical Simulation of Metal-Gate Work-function Fluctuation in High-kappa/Metal-Gate Devices
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Yu, Chia-Hui; Han, Ming-Hung; Cheng, Hui-Wen; Su, Zhong-Cheng; Li, Yiming; Watanabe, Hiroshi |
| 國立交通大學 |
2014-12-08T15:32:25Z |
High voltage characteristics of junctionless poly-silicon thin film transistors
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Cheng, Ya-Chi; Wu, Yung-Chun; Chen, Hung-Bin; Han, Ming-Hung; Lu, Nan-Heng; Su, Jun-Ji; Chang, Chun-Yen |
| 國立交通大學 |
2014-12-08T15:32:24Z |
Temperature-dependent characteristics of junctionless bulk transistor
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Han, Ming-Hung; Chen, Hung-Bin; Yen, Shiang-Shiou; Shao, Chi-Shen; Chang, Chun-Yen |
| 國立交通大學 |
2014-12-08T15:32:05Z |
Characteristics of Gate-All-Around Junctionless Poly-Si TFTs With an Ultrathin Channel
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Chen, Hung-Bin; Chang, Chun-Yen; Lu, Nan-Heng; Wu, Jia-Jiun; Han, Ming-Hung; Cheng, Ya-Chi; Wu, Yung-Chun |
| 國立交通大學 |
2014-12-08T15:30:40Z |
Improving Breakdown Voltage of LDMOS Using a Novel Cost Effective Design
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Han, Ming-Hung; Chen, Hung-Bin; Chang, Chia-Jung; Tsai, Chi-Chong; Chang, Chun-Yen |
| 國立交通大學 |
2014-12-08T15:30:35Z |
Device and Circuit Performance Estimation of Junctionless Bulk FinFETs
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Han, Ming-Hung; Chang, Chun-Yen; Chen, Hung-Bin; Cheng, Ya-Chi; Wu, Yung-Chun |
| 國立交通大學 |
2014-12-08T15:29:10Z |
Characteristic of p-Type Junctionless Gate-All-Around Nanowire Transistor and Sensitivity Analysis
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Han, Ming-Hung; Chang, Chun-Yen; Jhan, Yi-Ruei; Wu, Jia-Jiun; Chen, Hung-Bin; Cheng, Ya-Chi; Wu, Yung-Chun |
| 國立交通大學 |
2014-12-08T15:29:10Z |
Performance Comparison Between Bulk and SOI Junctionless Transistors
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Han, Ming-Hung; Chang, Chun-Yen; Chen, Hung-Bin; Wu, Jia-Jiun; Cheng, Ya-Chi; Wu, Yung-Chun |
| 國立交通大學 |
2014-12-08T15:25:39Z |
Statistical Analysis of Metal Gate Workfunction Variability, Process Variation, and Random Dopant Fluctuation in Nano-CMOS Circuits
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Hwang, Chih-Hong; Li, Tien-Yeh; Han, Ming-Hung; Lee, Kuo-Fu; Cheng, Hui-Wen; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:23:18Z |
A Novel Cost Effective Double Reduced Surface Field Laterally Diffused Metal Oxide Semiconductor Design for Improving Off-State Breakdown Voltage
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Han, Ming-Hung; Chen, Hung-Bin; Chang, Chia-Jung; Wu, Jia-Jiun; Chen, Wen-Chong; Tsai, Chi-Chong; Chang, Chun-Yen |
| 國立交通大學 |
2014-12-08T15:22:31Z |
Effect of Process Variation on 15-nm-Gate Stacked Multichannel Surrounding-Gate Field Effect Transistor
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Han, Ming-Hung; Cheng, Hui-Wen; Hwang, Chih-Hong; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:13:32Z |
The impact of high-frequency characteristics induced by intrinsic parameter fluctuations in nano-MOSFET device and circuit
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Han, Ming-Hung; Li, Yiming; Hwang, Chih-Hong |
| 國立交通大學 |
2014-12-08T15:13:07Z |
Statistical variability in FinFET devices with intrinsic parameter fluctuations
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Hwang, Chih-Hong; Li, Yiming; Han, Ming-Hung |
| 國立交通大學 |
2014-12-08T15:07:40Z |
Discrete-Dopant-Induced Power-Delay Characteristic Fluctuation in 16 nm Complementary Metal-Oxide-Semiconductor with High Dielectric Constant Material
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Han, Ming-Hung; Li, Yiming; Hwang, Chih-Hong |
| 國立交通大學 |
2014-12-08T15:07:27Z |
Process-Variation Effect, Metal-Gate Work-Function Fluctuation, and Random-Dopant Fluctuation in Emerging CMOS Technologies
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Li, Yiming; Hwang, Chih-Hong; Li, Tien-Yeh; Han, Ming-Hung |
| 國立交通大學 |
2014-12-08T15:07:15Z |
Simulation of characteristic variation in 16 nm gate FinFET devices due to intrinsic parameter fluctuations
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Li, Yiming; Hwang, Chih-Hong; Han, Ming-Hung |
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