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"hashizume m"的相關文件
顯示項目 96-105 / 127 (共13頁)
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| 國立臺灣科技大學 |
2018 |
A defect level monitor of resistive open defect at interconnects in 3D ICs by injected charge volume
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Ohtani, K.;Osato, N.;Hashizume, M.;Yotsuyanagi, H.;Lu, S.-K. |
| 國立臺灣科技大學 |
2018 |
Open defect detection with a built-in test circuit by IDDT appearance time in CMOS ICs
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Kambara A.; Yotsuyanagi H.; Miyoshi D.; Hashizume M.; Lu S.-K. |
| 國立臺灣科技大學 |
2018 |
Fault-aware page address remapping techniques for enhancing yield and reliability of flash memories
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Lu S.-K.; Yu S.-C.; Hashizume M.; Yotsuyanagi H. |
| 國家衛生研究院 |
2017-08-10 |
Heat wave and mortality: A multicountry, multicommunity study
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Guo, Y;Gasparrini, A;Armstrong, BG;Tawatsupa, B;Tobias, A;Lavigne, E;Coelho, M;Pan, X;Kim, H;Hashizume, M;Honda, Y;Guo, YL;Wu, CF;Zanobetti, A;Schwartz, JD;Bell, ML;Scortichini, M;Michelozzi, P;Punnasiri, K;Li, S;Tian, L;Garcia, SDO;Seposo, X;Overcenco, A;Zeka, A;Goodman, P;Dang, TN;Dung, DV;Mayvaneh, F;Saldiva, PHN;Williams, G;Tong, S |
| 國家衛生研究院 |
2017-05 |
Temporal changes in mortality related to extreme temperatures for 15 cities in northeast Asia: Adaptation to heat and maladaptation to cold
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Chung, Y;Noh, H;Honda, Y;Hashizume, M;Bell, ML;Guo, YLL;Kim, H |
| 國立臺灣科技大學 |
2017 |
Electrical tests for capacitive open defects in assembled PCBs
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Alia, F.A.B.;Odoriba, A.;Hashizume, M.;Yotsuyanagi, H.;Lu, S.-K. |
| 國立臺灣科技大學 |
2017 |
Electrical test of resistive and capacitive open defects at data bus in 3D memory IC
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Hashizume, M.;Shiraishi, Y.;Yotsuyanagi, H.;Yokoyama, H.;Tada, Tada T.;Lu, S.-K. |
| 國立臺灣科技大學 |
2017 |
Resistive open defects detected by interconnect testing based on charge volume injected to 3D ICs
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Ohtani, K.;Osato, N.;Hashizume, M.;Yotsuyanagi, H.;Lu, S.-K. |
| 國立臺灣科技大學 |
2017 |
A built-in current sensor made of a comparator of offset cancellation type for electrical interconnect tests of 3D ICs
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Kanda, M.;Hashizume, M.;Yotsuyanagi, H.;Lu, S.-K. |
| 國立臺灣科技大學 |
2016 |
Integration of Hard Repair Techniques with ECC for Enhancing Fabrication Yield and Reliability of Embedded Memories
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Lu, S.-K;Tsai, C.-J;Hashizume, M. |
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