|
English
|
正體中文
|
简体中文
|
2818311
|
|
???header.visitor??? :
28029395
???header.onlineuser??? :
1388
???header.sponsordeclaration???
|
|
|
|
???tair.name??? >
???browser.page.title.author???
|
"hayashibara k"???jsp.browse.items-by-author.description???
Showing items 1-2 of 2 (1 Page(s) Totally)
1
View [10|25|50] records per page
| 臺大學術典藏 |
2020-06-04T07:53:40Z |
An Automated W-Band On-Wafer Noise Figure Measurement System
|
Chen, S.;Yang, D.C.;Wang, H.;Hayashibara, K.;Godshalk, E.M.;Allen, B.; Chen, S.; Yang, D.C.; Wang, H.; Hayashibara, K.; Godshalk, E.M.; Allen, B.; HUEI WANG |
| 臺大學術典藏 |
2020-06-04T07:53:40Z |
An Automated W-Band On-Wafer Noise Figure Measurement System
|
Chen, S.;Yang, D.C.;Wang, H.;Hayashibara, K.;Godshalk, E.M.;Allen, B.; Chen, S.; Yang, D.C.; Wang, H.; Hayashibara, K.; Godshalk, E.M.; Allen, B.; HUEI WANG |
Showing items 1-2 of 2 (1 Page(s) Totally)
1
View [10|25|50] records per page
|
