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Showing items 1-2 of 2 (1 Page(s) Totally) 1 View [10|25|50] records per page
國立交通大學 |
2018-08-21T05:56:56Z |
Latchup in Bulk FinFET Technology
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Dai, C. -T.; Chen, S. -H.; Linten, D.; Scholz, M.; Hellings, G.; Boschke, R.; Karp, J.; Hart, M.; Groeseneken, G.; Ker, M. -D.; Mocuta, A.; Horiguchi, N. |
國立交通大學 |
2017-04-21T06:48:43Z |
Improvement on CDM ESD Robustness of High-Voltage Tolerant nLDMOS SCR Devices by Using Differential Doped Gate
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Chen, S. -H.; Linten, D.; Scholz, M.; Hellings, G.; Boschke, R.; Groeseneken, G.; Huang, Y. -C.; Ker, M. -D. |
Showing items 1-2 of 2 (1 Page(s) Totally) 1 View [10|25|50] records per page
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