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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
國立交通大學 2014-12-08T15:12:23Z Characterization of Si nanorods by spectroscopic ellipsometry with efficient theoretical modeling Hsu, Shih-Hsin; Liu, En-Shao; Chang, Yia-Chung; Hilfiker, James N.; Kim, Young Dong; Kim, Tae Jung; Lin, Chun-Jung; Lin, Gong-Ru
國立臺灣大學 2008-04 Characterization of Si nanorods by spectroscopic ellipsometry with efficient theoretical modeling Hsu, Shih-Hsin; Liu, En-Shao; Chang, Yia-Chung; Hilfiker, James N.; Kim, Young Dong; Kim, Tae Jung; Lin, Chun-Jung; Lin, Gong-Ru
國立臺灣大學 2008 Characterization of Si nanorods by spectroscopic ellipsometry with efficient theoretical modeling Hsu, Shih-Hsin; Liu, En-Shao; Chang, Yia-Chung; Hilfiker, James N.; Kim, Young Dong; Kim, Tae Jung; Lin, Chun-Jung; Lin, Gong-Ru

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