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Institution Date Title Author
臺大學術典藏 2022-06-30T02:06:08Z Oxidation-boosted charge trapping in ultra-sensitive van der Waals materials for artificial synaptic features Yang F.-S.; Li M.; Lee M.-P.; Ho I.-Y.; Chen J.-Y.; Ling H.; Li Y.; Chang J.-K.; Yang S.-H.; Chang Y.-M.; Lee K.-C.; Chou Y.-C.; Ho C.-H.; Li W.; Lien C.-H.; Lin Y.-F.; Yang F.-S.; Chou Y.-C; YI-CHIA CHOU
國立臺灣科技大學 2020 Oxidation-boosted charge trapping in ultra-sensitive van der Waals materials for artificial synaptic features Yang, F.-S.;Li, M.;Lee, M.-P.;Ho, I.-Y.;Chen, J.-Y.;Ling, H.;Li, Y.;Chang, J.-K.;Yang, S.-H.;Chang, Y.-M.;Lee, K.-C.;Chou, Y.-C.;Ho, C.-H.;Li, W.;Lien, C.-H.;Lin, Y.-F.

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