臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Institution	Date	Title	Author
臺大學術典藏	2021-08-05T02:41:46Z	Many-to-many comprehensive relative importance analysis and its applications to analysis of semiconductor electrical testing parameters	Shen Z;Hong A;Chen A.; Shen Z; Hong A; Chen A.; ARGON CHEN
臺大學術典藏	2020-03-02T06:39:58Z	Sample Efficient Regression Trees (SERT) for yield loss analysis	Chen, A.; Hong, A.; Ho, O.; Liu, C.-W.; Huang, Y.-H.; ARGON CHEN
臺大學術典藏	2020-03-02T06:39:55Z	Dominance index for many-to-many correlation and its applicaions to semiconductor yield analysis	Hong, A.; Chen, A.; ARGON CHEN
臺大學術典藏	2020-03-02T06:39:55Z	Piecewise regression model construction with sample efficient regression tree (SERT) and applications to semiconductor yield analysis	Hong, A.; Chen, A.; ARGON CHEN

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