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Showing items 1-12 of 12 (1 Page(s) Totally)
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| 國立臺灣大學 |
2003 |
Thermal Stress at Wafer Contact Points in Rapid Thermal Processing Investigated by Repeated Spike Treatment before Oxidation
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Hong, Chao-Chi; Chang, Chang-Yun; Lee, Chaung-Yuan; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2003 |
Thickness-Dependent Stress Effect in P-type Metal-Oxide-Semiconductor Structure Investigated by Substrate Injection Current
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Hong, Chao-Chi; Liao, Wei-Jian; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2003 |
Stress Distribution on (100) Si Wafer Mapped by Novel I-V Analysis of MOS Tunneling Diodes
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Hong, Chao-Chi; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2002-01 |
Reduction in Leakage Current of Low-Temperature Thin-Gate Oxide by Repeated Spike Oxidation Technique
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Hong, Chao-Chi; Chang, Chang-Yun; Lee, Chaung-Yuan; Hwu, Jenn-Gwo |
| 臺大學術典藏 |
2002-01 |
Reduction in Leakage Current of Low-Temperature Thin-Gate Oxide by Repeated Spike Oxidation Technique
|
Hong, Chao-Chi; Chang, Chang-Yun; Lee, Chaung-Yuan; Hwu, Jenn-Gwo; Hong, Chao-Chi; Chang, Chang-Yun; Lee, Chaung-Yuan; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2002 |
Local Thinning-Induced Oxide Nonuniformity Effect on the Tunneling Current of Ultrathin Gate Oxide
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Hong, Chao-Chi; Chen, Wei-Ren; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2002 |
Improvement in Ultrathin Rapid Thermal Oxide Uniformity by the Control of Gas Flow
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Hong, Chao-Chi; Yen, Yuh-Ren; Su, Jiann-Liang; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2002 |
Improvement of oxide thickness uniformity by high then low O2 pressure oxidation in rapid thermal processing
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Hong, Chao-Chi; Chen, Jenn-Long; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2002 |
Enhanced thermally induced stress effect on an ultrathin gate oxide
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Su, Jiann-Liang; Hong, Chao-Chi; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2002 |
Silicon Metal-Oxide-Semiconductor Solar Cells with Oxide Prepared by Room Temperature Anodization in Hydrofluosilicic Acid Solution
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Chen, Chih-Hao; Hong, Chao-Chi; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2001 |
Improvement in oxide thickness uniformity by repeated spikeoxidation
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Hong, Chao-Chi; Lee, Chuang-Yuan; Hsieh, Yuan-Long; Liu, Chean-Chung; Fong, I.-K.; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2001 |
Degradation in Metal-Oxide-Semiconductor Structure with Ultrathin Gate Oxide due to External Compressive Stress
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Hong, Chao-Chi; Hwu, Jenn-Gwo |
Showing items 1-12 of 12 (1 Page(s) Totally)
1
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