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"hsia lc"
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| 國立交通大學 |
2014-12-08T15:27:03Z |
Auger recombination enhanced hot carrier degradation in nMOSFETs with positive substrate bias
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Chiang, LP; Tsai, CW; Wang, T; Liu, UC; Wang, MC; Hsia, LC |
| 國立交通大學 |
2014-12-08T15:26:57Z |
Valence-band tunneling enhanced hot carrier degradation in ultra-thin oxide nMOSFETs
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Tsai, CW; Gu, SH; Chiang, LP; Wang, TH; Liu, YC; Huang, LS; Wang, MC; Hsia, LC |
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