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机构 日期 题名 作者
臺大學術典藏 2020-04-22T07:08:56Z Roughness-enhanced reliability of MOS tunneling diodes Lin, C.-H.; Yuan, F.; Shie, C.-R.; Chen, K.-F.; Hsu, B.-C.; Lee, M.H.; Pai, W.W.; Liu, C.W.
臺大學術典藏 2018-09-10T07:05:27Z Recovery of chromate from spent plating solutions by two-stage nanofiltration processes Chen, S.-S.;Hsu, B.-C.;Ko, C.-H.;Chuang, P.-C.; Chen, S.-S.; Hsu, B.-C.; Ko, C.-H.; Chuang, P.-C.; CHUN-HAN KO
臺大學術典藏 2018-09-10T04:55:29Z CMOS optoelectronics Liu, C.W.; Hsu, B.-C.; CHEE-WEE LIU
臺大學術典藏 2018-09-10T04:55:27Z Recessed oxynitride dots on self-assembled Ge quantum dots grown by LPD Kuo, P.-S.;Hsu, B.-C.;Chen, P.-W.;Chen, P.S.;Liu, C.W.; Kuo, P.-S.; Hsu, B.-C.; Chen, P.-W.; Chen, P.S.; Liu, C.W.; CHEE-WEE LIU
臺大學術典藏 2018-09-10T04:53:18Z Novel MIS Ge-Si quantum-dot infrared photodetectors Lin, C.-H.; Kuo, P.-S.; Chang, S.T.; Chen, P.S.; Liu, C.W.; Lu, J.-H.; Kuan, C.H.; CHIEH-HSIUNG KUAN; CHEE-WEE LIU; Hsu, B.-C.
臺大學術典藏 2018-09-10T04:33:14Z Isotope effect of hydrogen release in metal/oxide/n-silicon tunneling diodes Lin, C.-H.; Yuan, F.; Hsu, B.-C.; Liu, C.W.; CHEE-WEE LIU
臺大學術典藏 2018-09-10T04:33:14Z A high efficient 820 nm MOS Ge quantum dot photodetector Hsu, B.-C.; Chang, S.T.; Chen, T.-C.; Kuo, P.-S.; Chen, P.S.; Pei, Z.; Liu, C.W.; CHEE-WEE LIU
臺大學術典藏 2018-09-10T04:33:14Z Growth and electrical characteristics of liquid-phase deposited SiO2 on Ge Hsu, B.-C.; Hua, W.-C.; Shie, C.-R.; Chen, K.-F.; Liu, C.W.; CHEE-WEE LIU
臺大學術典藏 2018-09-10T04:33:13Z Strain-induced growth of SiO2 dots by liquid phase deposition Liu, C.W.; Hsu, B.-C.; Chen, K.-F.; Lee, M.H.; Shie, C.-R.; Chen, P.-S.; CHEE-WEE LIU
臺大學術典藏 2018-09-10T04:13:01Z Roughness-enhanced reliability of MOS tunneling diodes Lin, C.-H.; Yuan, F.; Shie, C.-R.; Chen, K.-F.; Hsu, B.-C.; Lee, M.H.; Pai, W.W.; Liu, C.W.; CHEE-WEE LIU
臺大學術典藏 2018-09-10T04:13:01Z Oxide roughness effect on tunneling current of MOS diodes Hsu, B.-C.; Chen, K.-F.; Lai, C.-C.; Lee, S.W.; Liu, C.W.; CHEE-WEE LIU
臺大學術典藏 2018-09-10T04:13:01Z High efficient 820 nm MOS Ge quantum dot photodetectors for short-reach integrated optical receivers with 1300 and 1550 nm sensitivity Hsu, B.-C.; Chang, S.T.; Shie, C.-R.; Lai, C.-C.; Chen, P.S.; Liu, C.W.; CHEE-WEE LIU
臺大學術典藏 2018-09-10T03:48:06Z A PMOS tunneling photodetector Hsu, B.-C.; Liu, C.W.; Liu, W.T.; Lin, C.-H.; CHEE-WEE LIU
臺大學術典藏 2018-09-10T03:48:06Z A comprehensive study of inversion current in MOS tunneling diodes Lin, C.-H.; Hsu, B.-C.; Lee, M.H.; Liu, C.W.; CHEE-WEE LIU
臺大學術典藏 2018-09-10T03:48:04Z Oxide roughness enhanced reliability of MOS tunneling diodes Lin, C.-H.; Lee, M.H.; Hsu, B.-C.; Chen, K.-F.; Shie, C.-R.; Liu, C.W.; CHEE-WEE LIU
臺大學術典藏 2018-09-10T03:48:04Z Novel photodetectors using metal-oxide-silicon tunneling structures Hsu, B.-C.; Liu, W.T.; Lin, C.-H.; Liu, C.W.; CHEE-WEE LIU
臺大學術典藏 2018-09-10T03:29:44Z Novel photodetector using MOS tunneling structures CHEE-WEE LIU; Liu, C.W.; Liu, W.T.; Lee, M.H.; Kuo, W.S.; Hsu, B.C.
國立臺灣科技大學 2018 Development and performance evaluation of image-based robotic waxing system for detailing automobiles Lin C.-Y.; Hsu B.-C.
淡江大學 2005-06 Effect of Pr substitution on the electronic structure of (La1-xPrx)0.85Zr0.15MnO3 Jan, J.-C.; Chiou, J.-W.; Tsai, H.-M.; Bao, C.-W.; Hsu, B.-C.; Ling, D.-C.; Pong, W.-F.; Tsai, M.-H.
國立臺灣大學 2004 Recessed Oxynitride Dots on Self-Assembled Ge Quantum Dots Grown by LPD Kuo, P.-S.; Hsu, B.-C.; Chen, P.-W.; Chen, P. S.; Liu, C. W.
國立臺灣大學 2004 Novel MIS Ge–Si Quantum-Dot Infrared Photodetectors Hsu, B.-C.; Lin, C.-H.; Kuo, P.-S.; Chang, S. T.; Chen, P. S.; Liu, C. W.; Lu, J.-H.; Kuan, C. H.
國立臺灣大學 2003-12 Modeling and simulation of high-bandwidth Si-based MOS/SOI photodetectors Liang, C.Y.; Hsu, B.C.; Lin, C.H.; Chang, S.T.; Liu, C.W.
國立臺灣大學 2003-12 MOS Ge/Si quantum dot infrared photodetectors with quantum dot and wetting layer responses Hsu, B.C.; Chang, S.T.; Kuo, P.S.; Chen, P.S.; Liu, C.W.; Lu, J.H.; Kuan, C.H.
國立臺灣大學 2003 Isotope effect of hydrogen release in metal/oxide/n-silicon tunneling diodes Lin, C. -H.; Yuan, F.; Hsu, B. -C.; Liu, C. W.
國立臺灣大學 2003 Growth and Electrical Characteristics of Liquid-Phase Deposited SiO2 on Ge Hsu, B.-C.; Hua, W.-C.; Shie, C.-R.; Chen, K.-F.; Liu, C. W.

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