元智大學 |
2013-02-27 |
Performance Evaluation for the High-tech Industry of the Science Park - A Case Study of Hsinchu Science Park
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Peng, J.-T.; Hsu, Chia-Yu |
元智大學 |
2013 |
Research on Framework of University-Industry Collaboration for Enhancing Sustainable Growth for NSC Science Park
|
Chien, C.; Peng, J.; Hsu, Chia-Yu |
元智大學 |
2013 |
Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole
|
Chien, C.; Hsu, Chia-Yu; Chang, K. |
元智大學 |
2013 |
emiconductor Fault Detection and Classification for Yield Enhancement and Manufacturing Intelligence
|
Chien, C.; Hsu, Chia-Yu; Chen, P. |
元智大學 |
2013 |
Research on Framework of University-Industry Collaboration for Enhancing Sustainable Growth for NSC Science Park
|
Chien, C.; Peng, J.; Hsu, Chia-Yu |
元智大學 |
2013 |
Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole
|
Chien, C.; Hsu, Chia-Yu; Chang, K. |
元智大學 |
2013 |
emiconductor Fault Detection and Classification for Yield Enhancement and Manufacturing Intelligence
|
Chien, C.; Hsu, Chia-Yu; Chen, P. |
元智大學 |
2013 |
Research on Framework of University-Industry Collaboration for Enhancing Sustainable Growth for NSC Science Park
|
Chien, C.; Peng, J.; Hsu, Chia-Yu |
元智大學 |
2013 |
Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole
|
Chien, C.; Hsu, Chia-Yu; Chang, K. |
元智大學 |
2013 |
Semiconductor Fault Detection and Classification for Yield Enhancement and Manufacturing Intelligence
|
Chien, C.; Hsu, Chia-Yu; Chen, P. |
元智大學 |
2013 |
Research on Framework of University-Industry Collaboration for Enhancing Sustainable Growth for NSC Science Park
|
Chien, C.; Peng, J.; Hsu, Chia-Yu |
元智大學 |
2013 |
Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole
|
Chien, C.; Hsu, Chia-Yu; Chang, K. |
元智大學 |
2013 |
Semiconductor Fault Detection and Classification for Yield Enhancement and Manufacturing Intelligence
|
Chien, C.; Hsu, Chia-Yu; Chen, P. |
元智大學 |
2013 |
Research on Framework of University-Industry Collaboration for Enhancing Sustainable Growth for NSC Science Park
|
Chien, C.; Peng, J.; Hsu, Chia-Yu |
元智大學 |
2013 |
Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole
|
Chien, C.; Hsu, Chia-Yu; Chang, K. |
元智大學 |
2013 |
Semiconductor Fault Detection and Classification for Yield Enhancement and Manufacturing Intelligence
|
Chien, C.; Hsu, Chia-Yu; Chen, P. |
元智大學 |
2013 |
Research on Framework of University-Industry Collaboration for Enhancing Sustainable Growth for NSC Science Park
|
Chien, C.; Peng, J.; Hsu, Chia-Yu |
元智大學 |
2013 |
Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole
|
Chien, C.; Hsu, Chia-Yu; Chang, K. |
元智大學 |
2013 |
Semiconductor Fault Detection and Classification for Yield Enhancement and Manufacturing Intelligence
|
Chien, C.; Hsu, Chia-Yu; Chen, P. |
元智大學 |
2012-12-02 |
Manufacturing Intelligence for Equipment Condition Monitoring in Semiconductor Manufacturing
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Chien, C.-F.; Yu, H.-C.; Hsu, Chia-Yu |
元智大學 |
2012-12-02 |
Clustering Ensembles to Failure Pattern Identification for Semiconductor Wafer Bin Map
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Hsu, Chia-Yu; Zhou, Z.-A. |
元智大學 |
2012-12 |
Manufacturing intelligence to forecast and reduce semiconductor cycle time
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Chien, C.-F.; Hsu, Chia-Yu; Chen, P.-N. |
元智大學 |
2012-12 |
Manufacturing intelligence to forecast and reduce semiconductor cycle time
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Chien, C.-F.; Hsu, Chia-Yu; Chen, P.-N. |
元智大學 |
2012-10-15 |
Intelligent Classification of Complicated Water Bin Map Patterns
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Hsu, Chia-Yu; Lee, C; Chien, C.; Chen, W.; Tsai, Y.; Chung, C.; Jou, B. |
元智大學 |
2012-07 |
Manufacturing intelligence for early warning of key equipment excursion for advanced equipment control in semiconductor manufacturing
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Hsu, Chia-Yu; Chien, Chen-Fu; Chen, Pei-Nong |