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Institution Date Title Author
國立成功大學 2004 Failure mechanism of amorphous and crystalline Ta-N films in the Cu/Ta-N/Ta/SiO2 structure Chang, Ching-Chun; Chen, Jen-Sue; Hsu, Wu-Shiung
國立成功大學 2003-10-15 Influence of Ta/Si atomic ratio on the interdiffusion between Ta-Si-N and Cu at elevated temperature Lai, L. W.; Chen, Jen-Sue; Hsu, Wu-Shiung

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