|
English
|
正體中文
|
简体中文
|
2826302
|
|
???header.visitor??? :
31983134
???header.onlineuser??? :
535
???header.sponsordeclaration???
|
|
|
|
???tair.name??? >
???browser.page.title.author???
|
"huang daming"???jsp.browse.items-by-author.description???
Showing items 1-3 of 3 (1 Page(s) Totally)
1
View [10|25|50] records per page
| 國立交通大學 |
2019-09-02T07:45:40Z |
Trapping and Detrapping of Oxide Border Traps in Al2O3 Gate Dielectric in MOS2 n-MOSFETs under PBTI Stress
|
Yuan, Hui-Wen; Shen, Hui; Li, Jun-Jie; Shao, Jinhai; Huang, Daming; Chen, Yi-Fang; Wang, P. F.; Ding, S. J.; Chin, Albert; Li, Ming-Fu |
| 國立交通大學 |
2018-08-21T05:54:00Z |
PBTI Investigation of MoS2 n-MOSFET With Al2O3 Gate Dielectric
|
Yuan, Hui-Wen; Shen, Hui; Li, Jun-Jie; Shao, Jinhai; Huang, Daming; Chen, Yi-Fang; Wang, P. F.; Ding, S. J.; Chin, Albert; Li, Ming-Fu |
| 國立交通大學 |
2017-04-21T06:56:31Z |
Investigation of Traps at MoS2/Al2O3 Interface in nMOSFETs by Low-Frequency Noise
|
Yuan, Hui-Wen; Shen, Hui; Li, Jun-Jie; Shao, Jinhai; Huang, Daming; Chen, Yi-Fang; Wang, P. F.; Ding, S. J.; Liu, W. J.; Chin, Albert; Li, Ming-Fu |
Showing items 1-3 of 3 (1 Page(s) Totally)
1
View [10|25|50] records per page
|
