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Showing items 1-10 of 16  (2 Page(s) Totally)
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Institution Date Title Author
臺大學術典藏 2020-06-11T06:50:43Z A Charge-Sensing-Capable Source Driver for TFT Array Testing in System-on-Panel Displays. Lin, Chen-Wei;Huang, Jiun-Lang; Lin, Chen-Wei; Huang, Jiun-Lang; JIUN-LANG HUANG
臺大學術典藏 2020-06-11T06:50:41Z Guest Editors' Introduction: A Promising Alternative to Conventional Silicon Huang, Jiun-Lang;Cheng, Kwang-Ting; Huang, Jiun-Lang; Cheng, Kwang-Ting; JIUN-LANG HUANG
臺大學術典藏 2020-06-11T06:50:40Z An FPGA-Based Data Receiver for Digital IC Testing. Huang, Wei-Chen;Hou, Guan-Hao;Huang, Jiun-Lang;Kuo, Terry; Huang, Wei-Chen; Hou, Guan-Hao; Huang, Jiun-Lang; Kuo, Terry; JIUN-LANG HUANG
臺大學術典藏 2020-06-11T06:50:38Z A robust ADC code hit counting technique. Huang, Jiun-Lang;Chou, Kuo-Yu;Lu, Ming-Huan;Huang, Xuan-Lun; Huang, Jiun-Lang; Chou, Kuo-Yu; Lu, Ming-Huan; Huang, Xuan-Lun; JIUN-LANG HUANG
臺大學術典藏 2018-09-10T06:03:13Z A low-cost jitter measurement technique for BIST applications Huang, Jiun-Lang; J.-L. Huang; J.-J. Huang; Y.-S. Liu
國立臺灣大學 2009 LPTest: A Flexible Low-Power Test Pattern Generator Wu, Meng-Fan; Hu, Kai-Shun; Huang, Jiun-Lang
國立臺灣大學 2009 Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment Wu, Meng-Fan; Huang, Jiun-Lang; Wen, Xiaoqing; Miyase, K.
國立臺灣大學 2009 A Charge-Sensing-Capable Source Driver for TFT Array Testing in System-on-Panel Displays Lin, Chen-Wei; Huang, Jiun-Lang
國立臺灣大學 2006 A low-cost jitter measurement technique for BIST applications Huang, Jiun-Lang; Huang, Jui-Jer; Liu, Yuan-Shuang
國立臺灣大學 2006 On-Chip Random Jitter Testing Using Low Tap-Count Coarse Delay Lines Huang, Jiun-Lang

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