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Taiwan Academic Institutional Repository >
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"hwang chih hong"
Showing items 31-44 of 44 (2 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:09:07Z |
The geometric effect and programming current reduction in cylindrical-shaped phase change memory
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Li, Yiming; Hwang, Chih-Hong; Li, Tien-Yeh; Cheng, Hui-Wen |
| 國立交通大學 |
2014-12-08T15:09:00Z |
Random-Dopant-Induced Variability in Nano-CMOS Devices and Digital Circuits
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Li, Yiming; Hwang, Chih-Hong; Li, Tien-Yeh |
| 國立交通大學 |
2014-12-08T15:08:49Z |
The effect of the geometry aspect ratio on the silicon ellipse-shaped surrounding-gate field-effect transistor and circuit
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Li, Yiming; Hwang, Chih-Hong |
| 國立交通大學 |
2014-12-08T15:08:40Z |
Doping profile and Ge-dose optimization for silicon-germanium heterojunction bipolar transistors
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Li, Yiming; Chen, Ying-Chieh; Hwang, Chih-Hong |
| 國立交通大學 |
2014-12-08T15:08:33Z |
Characteristic fluctuation dependence on discrete dopant for 16nm SOI FinFETs at different temperature
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Li, Yiming; Hwang, Chih-Hong; Yu, Shao-Ming; Huang, Hsuan-Ming; Yeh, Ta-Ching; Cheng, Hui-Wen; Chen, Hung-Ming; Hwang, Jiunn-Ren; Yang, Fu-Liang |
| 國立交通大學 |
2014-12-08T15:07:40Z |
Discrete-Dopant-Induced Power-Delay Characteristic Fluctuation in 16 nm Complementary Metal-Oxide-Semiconductor with High Dielectric Constant Material
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Han, Ming-Hung; Li, Yiming; Hwang, Chih-Hong |
| 國立交通大學 |
2014-12-08T15:07:35Z |
Effect of UV illumination on inverted-staggered a-Si : H thin film transistors
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Li, Yiming; Lou, Jen-Chung; Chen, Chung-Le; Hwang, Chih-Hong; Yan, Shuoting |
| 國立交通大學 |
2014-12-08T15:07:27Z |
Process-Variation Effect, Metal-Gate Work-Function Fluctuation, and Random-Dopant Fluctuation in Emerging CMOS Technologies
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Li, Yiming; Hwang, Chih-Hong; Li, Tien-Yeh; Han, Ming-Hung |
| 國立交通大學 |
2014-12-08T15:07:15Z |
Simulation of characteristic variation in 16 nm gate FinFET devices due to intrinsic parameter fluctuations
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Li, Yiming; Hwang, Chih-Hong; Han, Ming-Hung |
| 國立交通大學 |
2014-12-08T15:07:07Z |
Asymmetric gate capacitance and dynamic characteristic fluctuations in 16 nm bulk MOSFETs due to random distribution of discrete dopants
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Lee, Kuo-Fu; Li, Yiming; Hwang, Chih-Hong |
| 國立交通大學 |
2014-12-08T15:07:06Z |
Numerical simulation of static noise margin for a six-transistor static random access memory cell with 32nm fin-typed field effect transistors
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Li, Yiming; Hwang, Chih-Hong; Yu, Shao-Ming |
| 國立交通大學 |
2014-12-08T15:02:42Z |
Reduction of Discrete-Dopant-Induced High-Frequency Characteristic Fluctuations in Nanoscale CMOS Circuit
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Li, Yiming; Hwang, Chih-Hong; Yeh, Ta-Ching; Huang, Hsuan-Ming; Li, Tien-Yeh; Cheng, Hui-Wen |
| 國立交通大學 |
2014-12-08T15:02:21Z |
Comprehensive Examination of Threshold Voltage Fluctuations in Nanoscale Planar MOSFET and Bulk FinFET Devices
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Hwang, Chih-Hong; Cheng, Hui-Wen; Yeh, Ta-Ching; Li, Tien-Yeh; Huang, Hsuan-Ming; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:01:46Z |
Three-Dimensional Numerical Simulation of Switching Dynamics for Cylindrical-Shaped Phase Change Memory
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Li, Yiming; Hwang, Chih-Hong; Kuo, Yi-Ting; Cheng, Hui-Wen |
Showing items 31-44 of 44 (2 Page(s) Totally)
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