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机构 日期 题名 作者
臺大學術典藏 2018-09-10T05:52:21Z Application of irradiation-then-nitridation to improve the radiation hardness in MOS gate dielectrics Lee, K.-C.;Hwu, J.-G.; Lee, K.-C.; Hwu, J.-G.; JENN-GWO HWU
臺大學術典藏 2018-09-10T05:52:21Z The effect of postoxidation cooling in oxygen on the interface property of MOS capacitors Hwu, J.-G.;Chang, J.-J.;Wang, W.-S.; Hwu, J.-G.; Chang, J.-J.; Wang, W.-S.; JENN-GWO HWU
臺大學術典藏 2018-09-10T05:52:20Z Improvement in electrical characteristics of high- k Al2O 3 gate dielectric by field-assisted nitric oxidation Hwu, J.-G.; JENN-GWO HWU; Chuang, K.-C.
臺大學術典藏 2018-09-10T05:52:20Z Impact of strain-temperature stress on ultrathin oxide Tung, C.-W.; Yang, Y.-L.; Hwu, J.-G.; JENN-GWO HWU
臺大學術典藏 2018-09-10T05:52:20Z Thin-gate oxides prepared by pure water anodization followed by rapid thermal densification Jeog, M.-J.;Hwu, J.-G.; Jeog, M.-J.; Hwu, J.-G.; JENN-GWO HWU
臺大學術典藏 2018-09-10T05:52:19Z Lateral nonuniformity of effective oxide charges in MOS capacitors with A12O3 gate dielectrics Huang, S.-W.; Hwu, J.-G.; JENN-GWO HWU
臺大學術典藏 2018-09-10T04:08:54Z Improvement of oxide thickness uniformity by high then low O2 pressure oxidation in rapid thermal processing Hong, C.-C.; Chen, J.-L.; Hwu, J.-G.; JENN-GWO HWU
臺大學術典藏 2018-09-10T04:08:54Z Improvement in ultrathin rapid thermal oxide uniformity by the control of gas flow Hong, C.-C.; Yen, Y.-R.; Su, J.-L.; Hwu, J.-G.; JENN-GWO HWU
臺大學術典藏 2018-09-10T04:08:54Z Effect of mechanical stress on characteristics of silicon thermal oxides JENN-GWO HWU; Yen, J.-Y.; Huang, C.-H.; Hwu, J.-G.
臺大學術典藏 2018-09-10T04:08:54Z Role of stress in irradiation-then-anneal technique used for improving radiation hardness of metal-insulator-semiconductor devices Shu, K.; Liao, C.; Hwu, J.-G.; JENN-GWO HWU

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