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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
臺大學術典藏 2020-01-06T03:11:12Z Electrical Characterization of the Insulating Property of Ta2o5 in Al-Ta2o5-Sio2-Si Capacitors by a Low-Frequency C/V Technique Hwu, Jg; Lin, St; SHIANG-TAI LIN

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