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Institution	Date	Title	Author
臺大學術典藏	2020-01-06T03:11:12Z	Electrical Characterization of the Insulating Property of Ta2o5 in Al-Ta2o5-Sio2-Si Capacitors by a Low-Frequency C/V Technique	Hwu, Jg; Lin, St; SHIANG-TAI LIN

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