臺大學術典藏 |
2018-09-10T06:35:00Z |
STI Mechanical Stress Induced Subthreshold Kink Effect of 40nm PD SOI NMOS Devices
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J. B. kuo; M. Ma; C. T. Tsai; C. S. Yeh; D. Chen; JAMES-B KUO; I. Lin; V. Su |
臺大學術典藏 |
2018-09-10T06:34:59Z |
Narrow Band Gap Semiconductor
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H. H. Lin; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T06:34:59Z |
Triple-Threshold Static Power Minimization Technique in High-Level Synthesis for Designing High-Speed Low-Power SOC Applications Using 90nm MTCMOS Technology
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H. I. Chen;E. K. Loo;J. B. Kuo;M. J. Syrzycki; H. I. Chen; E. K. Loo; J. B. Kuo; M. J. Syrzycki; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T06:34:59Z |
Triple-Threshold Static Power Minimization Technique in High-Level Synthesis for Designing High-Speed Low-Power SOC Applications Using 90nm MTCMOS Technology
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H. I. Chen;E. K. Loo;J. B. Kuo;M. J. Syrzycki; H. I. Chen; E. K. Loo; J. B. Kuo; M. J. Syrzycki; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T06:02:16Z |
Gate-Level Dual-Threshold Static Power Optimization Methodology (GDSPOM) Using Path-Based Static Timing Analysis (STA) Technique
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B. Chung; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T06:02:16Z |
Analysis of Fringing Electric Field Related Capacitance Behavior of Narrow-Channel FD SOI NMOS Devices Using 3D Simulation
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C. C. Chen; J. B. Kuo; K. W. Su; S. Liu; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T06:02:15Z |
Partitioned gate tunnelling current model considering distributed effect for CMOS devices with ultra-thin (1 nm) gate oxide
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C. H. Lin; J. B. KUO; K. W. Su; S. Liu; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T06:02:15Z |
Gate capacitances behavior of nanometer FD SOI CMOS devices with HfO2 high-k gate dielectric considering vertical and fringing displacement effects using 2-D simulation
|
Y. S. Lin; C. H. Lin; J. B. Kuo; K. W. Su; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T06:02:15Z |
Analysis of the gate-source/drain capacitance behavior of a narrow-channel FD SOINMOS device considering the 3-D fringing capacitances using 3-D simulation
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C. C. Chen; J. B. Kuo; K. W. Su,; S. Liu; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T06:02:15Z |
Gate-Level Dual-Threshold Static Power Optimization Methodology (GDSPOM) for Designing High-Speed Low-Power SOC Applications Using 90nm MTCMOS Technology
|
B. Chung; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T06:02:15Z |
Fringing Effects of Nanometer SOI CMOS Devices
|
J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T05:26:48Z |
Fringing-Induced Narrow-Channel-Effect (FINCE) RElated Capacitance Behavior of Nanometer FD SOI NMOS Devices Using Mesa-Isolation Via 3D Simulation
|
G. S. Lin; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T05:26:48Z |
CGS Capacitance Phenomenon of 100nm FD SOI CMOS Devices with HfO2 High-k Gate Dielectric Considering Vertical and Fringing Displacement Effects
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Y. S. Lin; C. H. Lin; J. B. Kuo; K. W. Su; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T04:59:04Z |
Gate Misalignment Effect Related Capacitance Behavior of a 100nm DG FD SOI NMOS Device with n+/p+ Poly Top/Bottom Gate
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C. H. Hsu; C. P. Yang; JAMES-B KUO; J. B. Kuo |
臺大學術典藏 |
2018-09-10T04:59:04Z |
Low-Voltage SOI CMOS VLSI Devices and Circuits
|
J. B. Kuo; S. C. Lin; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T04:59:03Z |
A Compact Threshold Voltage Model for Gate Misalignment Effect of DG FD SOI NMOS Devices Considering Fringing Electric Field Effects
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E. C. Sun; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T04:59:03Z |
PD SOI-Technology SPICE Models
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J. B. Kuo; S. C. Lin; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T04:59:03Z |
A Low-Voltage CMOS Load Driver with the Adiabatic and Bootstrap Techniques for Low-Power System Applications
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J. B. Kuo;H. P. Chen; J. B. Kuo; H. P. Chen; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T04:59:03Z |
A Low-Voltage CMOS Load Driver with the Adiabatic and Bootstrap Techniques for Low-Power System Applications
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J. B. Kuo;H. P. Chen; J. B. Kuo; H. P. Chen; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T04:59:03Z |
Trends on CMOS VLSI
|
J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T04:35:19Z |
Compact Modeling of SOI CMOS VLSI Devices
|
J. .B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T04:35:19Z |
Asymmetric Gate Misalignment Effect on Subthreshold Characteristics DG SOI NMOS Devices Considering Fringing Electric Field Effect
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M. T. Lin; E. C. Sun; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T04:35:18Z |
Ultra-low-voltage SOI CMOS Inverting Driver Circuit Using Effective Charge Pump Based on Bootstrap Technique
|
JAMES-B KUO; J. B. Kuo; J. H. T. Chen |
臺大學術典藏 |
2018-09-10T04:35:18Z |
Modeling the Fringing Electric Field Effect on the Threshold Voltage of FD SOI NMOS Devices with the LDD/Sidewall Oxide Spacer Structure
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S. C. Lin; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T04:35:18Z |
SOI CMOS VLSI
|
J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T04:35:18Z |
Novel Sub-1V CMOS Domino Dynamic Logic Circuit Using a Direct Bootstrap (DB) Technique for Low-voltage CMOS VLSI
|
P. C. Chen; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T04:35:18Z |
A Novel 0.8V BP-DTMOS Content Addressable Memory Cell Circuit Derived from SOI-DTMOS Techniques
|
E. Shen; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T04:35:18Z |
Analysis of Gate Misalignment Effect on the Threshold Voltage of Double-Gate (DG) Ultrathin FD SOI NMOS Devices Using a Compact Model Considering Fringing Electric Field Effect
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J. B. Kuo; E. C. Sun; M. T. Lin; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T04:15:06Z |
The Fringing Electric Field Effect on the Short-Channel Effect Threshold Voltage of FD SOI NMOS Devices with LDD/Sidewall Oxide Spacer Structure
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J. B. Kuo; S. C. Lin; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T04:15:06Z |
Fringing-Induced Barrier Lowering (FIBL) Effects of 100nm FD SOI NMOS Devices with High Permittivity Gate Dielectrics and LDD/Sidewall Oxide Spacer
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S. C. Lin; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T04:15:06Z |
Compact Breakdown Model for PD SOI NMOS Devices Considering BJT/MOS Impact Ionization for SPICE Circuits Simulation
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J. B. Kuo; S. C. Lin; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T04:15:06Z |
High-Temperature Quasi-Saturation Model of High-Voltage DMOS Power Devices
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C. L. Yang; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T04:15:05Z |
Sub-1V CMOS Large Capacitive-Load Driver Circuit Using Direct Bootstrap Technique for Low-Voltage CMOS VLSI
|
P. C. Chen; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T04:15:05Z |
A 0.8-V 128-Kb Four-Way Set-Associative Two-Level CMOS Cache Memory Using Two-Stage Wordline/Bitline-Oriented Tag-Compare (WLOTC/BLOTC) Scheme
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P. F. Lin; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T03:50:15Z |
Novel 0.8V True-Single-Phase-Clocking (TSPC) Latches Using PD-SOI DTMOS Techniques for Low-Voltage CMOS VLSI Circuits
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J. B. Kuo; T. Y. Chiang; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T03:50:15Z |
Low-Voltage SOI CMOS VLSI Devices and Circuits
|
J. B. Kuo; S. C. Lin; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T03:50:14Z |
A 1-V 128-kb four-way set-associative CMOS cache memory using wordline-oriented tag-compare (WLOTC) structure with the content-addressable-memory (CAM) 10-transistor tag cell
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P. F. Lin; J. B. Kuo; P. F. Lin; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T03:50:14Z |
A 1-V 128-kb four-way set-associative CMOS cache memory using wordline-oriented tag-compare (WLOTC) structure with the content-addressable-memory (CAM) 10-transistor tag cell
|
P. F. Lin; J. B. Kuo; P. F. Lin; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T03:50:14Z |
A novel low-voltage content-addressable-memory (CAM) cell with a fast tag-compare capability using partially depleted (PD) SOI CMOS dynamic-threshold (DTMOS) techniques
|
S. C. Liu; J. B. Kuo; Frank Wu; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T03:50:14Z |
Modeling of Single-Transistor Latch Behavior in Partially-Depleted (PD) SOI CMOS Devices Using a Concise SOI-SPICE Model
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J. B. Kuo; S. C. Lin; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T03:50:14Z |
Future Trends on SOI CMOS VLSI
|
J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2013-12 |
Turn-on Transient Behavior of PD SOI NMOS Device Considering the Back-Gate Bias Effect
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D. H. Lung;J. B. Kuo;D. Chen; D. H. Lung; J. B. Kuo; D. Chen; JAMES-B KUO |
臺大學術典藏 |
2013-12 |
Turn-on Transient Behavior of PD SOI NMOS Device Considering the Back-Gate Bias Effect
|
D. H. Lung;J. B. Kuo;D. Chen; D. H. Lung; J. B. Kuo; D. Chen; JAMES-B KUO |
臺大學術典藏 |
2012-12 |
A Closed-form Analytical Transient Response Model for On-Chip Distortionless Interconnect
|
T. C. Liu;J. B. Kuo;S. D. Zhang; T. C. Liu; J. B. Kuo; S. D. Zhang; JAMES-B KUO |
臺大學術典藏 |
2012-12 |
A Closed-form Analytical Transient Response Model for On-Chip Distortionless Interconnect
|
T. C. Liu;J. B. Kuo;S. D. Zhang; T. C. Liu; J. B. Kuo; S. D. Zhang; JAMES-B KUO |
臺大學術典藏 |
2012-04 |
Function of the parasitic bipolar transistor in the 40 nm PD SOI NMOS device considering the floating body effect
|
C. H. Chen;J. B. Kuo;D. Chen;C. S. Yeh; C. H. Chen; J. B. Kuo; D. Chen; C. S. Yeh; JAMES-B KUO |
臺大學術典藏 |
2012-04 |
Function of the parasitic bipolar transistor in the 40 nm PD SOI NMOS device considering the floating body effect
|
C. H. Chen;J. B. Kuo;D. Chen;C. S. Yeh; C. H. Chen; J. B. Kuo; D. Chen; C. S. Yeh; JAMES-B KUO |
臺大學術典藏 |
2001-05 |
Low-Voltage Content Addressable Memory Cell with a Fast Tag-Compare Capability Using Partially-Depleted SOI CMOS Dynamic-Threshold Techniques
|
JAMES-B KUO; S. C. Liu; J. B. Kuo |
臺大學術典藏 |
1999-05 |
A 1.5-V CMOS all-N-logic true-single-phase bootstrapped dynamic-logic circuit suitable for low supply voltage and high-speed pipelined system operation
|
J. H. Lou; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
0-01 |
A High-Speed 1.5V Clocked BiCMOS Latch for BiCMOS Dynamic Pipelined Digital Logic VLSI Systems
|
J. B. Kuo;J. H. Lou; J. B. Kuo; J. H. Lou; JAMES-B KUO |