臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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	2019臺灣學術機構典藏研討會
	機構典藏系統RC7版本已發佈

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	臺大學術典藏NTU Scholars

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Institution	Date	Title	Author
臺大學術典藏	2018-09-10T15:00:17Z	Power consumption optimization methodology (PCOM) for low-power/ low-voltage 32-bit microprocessor circuit design via MTCMOS	C. B. Hsu;J. B. Kuo; C. B. Hsu; J. B. Kuo; JAMES-B KUO
臺大學術典藏	2018-09-10T15:00:17Z	Back-Gate-Baias Induced Floating-Body-Related Subthreshold Characteristics of SOI NMOS Device	S. K. Hu;D. H. Lung;J. B. Kuo;D. Chen; S. K. Hu; D. H. Lung; J. B. Kuo; D. Chen; JAMES-B KUO
臺大學術典藏	2018-09-10T15:00:17Z	Back-Gate-Baias Induced Floating-Body-Related Subthreshold Characteristics of SOI NMOS Device	S. K. Hu;D. H. Lung;J. B. Kuo;D. Chen; S. K. Hu; D. H. Lung; J. B. Kuo; D. Chen; JAMES-B KUO
臺大學術典藏	2018-09-10T09:50:25Z	Function of the Upper/Lower Parasitic BJTs in 40nm PD SOI NMOS Device due to the Back-Gate Bias Effect	A. P. Chuang;S. I. Su;Z. H. Yang;J. B. Kuo;D. Chen;C. S. Yeh; A. P. Chuang; S. I. Su; Z. H. Yang; J. B. Kuo; D. Chen; C. S. Yeh; JAMES-B KUO
臺大學術典藏	2018-09-10T09:50:25Z	Function of the Upper/Lower Parasitic BJTs in 40nm PD SOI NMOS Device due to the Back-Gate Bias Effect	A. P. Chuang;S. I. Su;Z. H. Yang;J. B. Kuo;D. Chen;C. S. Yeh; A. P. Chuang; S. I. Su; Z. H. Yang; J. B. Kuo; D. Chen; C. S. Yeh; JAMES-B KUO
臺大學術典藏	2018-09-10T09:50:25Z	Novel Power Consumption Reduction strategy Using Mixed-Vth Cells for Optimizaing the Cells on Critical Paths for Low-Power SOC	G. Lin;J. B. Kuo; G. Lin; J. B. Kuo; JAMES-B KUO
臺大學術典藏	2018-09-10T09:50:25Z	Novel Power Consumption Reduction strategy Using Mixed-Vth Cells for Optimizaing the Cells on Critical Paths for Low-Power SOC	G. Lin;J. B. Kuo; G. Lin; J. B. Kuo; JAMES-B KUO
臺大學術典藏	2018-09-10T09:50:25Z	Turn-off Transient Behavior of PD SOI NMOS Device Considering the Back-Gate Bias Effect	D. H. Lung; J. B. Kuo; D. Chen; JAMES-B KUO; D. H. Lung;J. B. Kuo;D. Chen
臺大學術典藏	2018-09-10T09:50:25Z	Turn-off Transient Behavior of PD SOI NMOS Device Considering the Back-Gate Bias Effect	D. H. Lung; J. B. Kuo; D. Chen; JAMES-B KUO; D. H. Lung;J. B. Kuo;D. Chen
臺大學術典藏	2018-09-10T09:50:25Z	Modeling Advanced PD SOI CMOS Devices	J. B. Kuo; J. B. Kuo; JAMES-B KUO
臺大學術典藏	2018-09-10T09:50:25Z	Modeling Advanced PD SOI CMOS Devices	J. B. Kuo; J. B. Kuo; JAMES-B KUO
臺大學術典藏	2018-09-10T09:50:25Z	Back-Gate Bias Effect of PD SOI NMOS Device Considering BJT	D. H. Lung;J. B. Kuo; D. H. Lung; J. B. Kuo; JAMES-B KUO
臺大學術典藏	2018-09-10T09:50:25Z	Back-Gate Bias Effect of PD SOI NMOS Device Considering BJT	D. H. Lung;J. B. Kuo; D. H. Lung; J. B. Kuo; JAMES-B KUO
臺大學術典藏	2018-09-10T09:50:25Z	Analytical Drain Current Model for Poly-Si Thin-Film Transistors Biased in Strong Inversion Considering Degradation of Tail States at Grain Boundary	L. L. Wang;J. B. Kuo;S. Zhang; L. L. Wang; J. B. Kuo; S. Zhang; JAMES-B KUO
臺大學術典藏	2018-09-10T09:50:25Z	Analytical Drain Current Model for Poly-Si Thin-Film Transistors Biased in Strong Inversion Considering Degradation of Tail States at Grain Boundary	L. L. Wang;J. B. Kuo;S. Zhang; L. L. Wang; J. B. Kuo; S. Zhang; JAMES-B KUO
臺大學術典藏	2018-09-10T09:24:49Z	Compact Modeling of SOI CMOS Devices	J. B. Kuo; J. B. Kuo; JAMES-B KUO
臺大學術典藏	2018-09-10T09:24:49Z	Compact Modeling of SOI CMOS Devices	J. B. Kuo; J. B. Kuo; JAMES-B KUO
臺大學術典藏	2018-09-10T09:24:49Z	Grain-Boundary Impact Ionization-Induced Current Hump Effects of Polysilicon TFTs	S. Zhang; JAMES-B KUO; J. B. Kuo; T. C. Liu;J. B. Kuo;S. Zhang; T. C. Liu
臺大學術典藏	2018-09-10T09:24:49Z	Grain-Boundary Impact Ionization-Induced Current Hump Effects of Polysilicon TFTs	S. Zhang; JAMES-B KUO; J. B. Kuo; T. C. Liu;J. B. Kuo;S. Zhang; T. C. Liu
臺大學術典藏	2018-09-10T09:24:49Z	Grain Boundary-Related Kink Effects of Poly-Si TFTs	T. C. Liu;J. B. Kuo; T. C. Liu; J. B. Kuo; JAMES-B KUO
臺大學術典藏	2018-09-10T09:24:49Z	Grain Boundary-Related Kink Effects of Poly-Si TFTs	T. C. Liu;J. B. Kuo; T. C. Liu; J. B. Kuo; JAMES-B KUO
臺大學術典藏	2018-09-10T09:24:49Z	Modeling Hot-Carrier-Induced Reliability of Poly-silicon Thin Film Transistors	L. L. Wang;J. B. Kuo;S. Zhang; L. L. Wang; J. B. Kuo; S. Zhang; JAMES-B KUO
臺大學術典藏	2018-09-10T09:24:49Z	Modeling Hot-Carrier-Induced Reliability of Poly-silicon Thin Film Transistors	L. L. Wang;J. B. Kuo;S. Zhang; L. L. Wang; J. B. Kuo; S. Zhang; JAMES-B KUO
臺大學術典藏	2018-09-10T09:24:48Z	Foating-Body Kink-Effect Related Parasitic Bipolar Transistor Behavior in Poly-Si TFT	T. C. Liu;J. B. Kuo;S. D. Zhang; T. C. Liu; J. B. Kuo; S. D. Zhang; JAMES-B KUO
臺大學術典藏	2018-09-10T09:24:48Z	Foating-Body Kink-Effect Related Parasitic Bipolar Transistor Behavior in Poly-Si TFT	T. C. Liu;J. B. Kuo;S. D. Zhang; T. C. Liu; J. B. Kuo; S. D. Zhang; JAMES-B KUO

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