臺大學術典藏 |
2018-09-10T09:24:48Z |
Turn-off Transient Behavior of 40nm PD SOI NMOS Device Considering the Floating Body Effect
|
S. W. Fang; J. B. Kuo; D. Chen; C. S. Yeh; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T09:24:48Z |
Floating-Body Kink Effect: Ply-Si TFT versus SOI CMOS
|
T. C. Liu;J. B. Kuo;S. D. Zhang; T. C. Liu; J. B. Kuo; S. D. Zhang; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T09:24:48Z |
Floating-Body Kink Effect: Ply-Si TFT versus SOI CMOS
|
T. C. Liu;J. B. Kuo;S. D. Zhang; T. C. Liu; J. B. Kuo; S. D. Zhang; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T09:24:48Z |
Design of Distortionless Interconnects via Main/auxiliary Structure with LC Line for High Speed On-chip Transmission
|
T. C. Liu;J. B. Kuo;S. D. Zhang; T. C. Liu; J. B. Kuo; S. D. Zhang; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T09:24:48Z |
Design of Distortionless Interconnects via Main/auxiliary Structure with LC Line for High Speed On-chip Transmission
|
T. C. Liu;J. B. Kuo;S. D. Zhang; T. C. Liu; J. B. Kuo; S. D. Zhang; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T08:46:16Z |
Modeling the Floating-Body-Effect-Related Transient Behavior of 40nm PD SOI NMOS Device via the SPICE Bipolar/MOS Model
|
S. W. Fang; J. B. Kuo; D. Chen; C. S. Yeh; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T08:46:16Z |
A Novel Low-Voltage Silicon-On-Insulator (SOI) CMOS Complementary Pass-Transistor Logic (CPL) Circuit using Asymmetrical Dynamic Threshold Pass-Transistor (ADTPT) Technique
|
J. B. Kuo;B. T. Wang; J. B. Kuo; B. T. Wang; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T08:46:16Z |
A Novel Low-Voltage Silicon-On-Insulator (SOI) CMOS Complementary Pass-Transistor Logic (CPL) Circuit using Asymmetrical Dynamic Threshold Pass-Transistor (ADTPT) Technique
|
J. B. Kuo;B. T. Wang; J. B. Kuo; B. T. Wang; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T08:46:16Z |
A Charge-Sharing-Problem-Free 1.5V BiCMOS Dynamic Logic Gate Circuit
|
J. B. Kuo; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T08:46:16Z |
A Charge-Sharing-Problem-Free 1.5V BiCMOS Dynamic Logic Gate Circuit
|
J. B. Kuo; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T08:46:15Z |
Analysis of Turn-off Transient Behavior of the 40nm PD SOI NMOS Device with the Floating Body Effect
|
C. H. Chen; J. B. Kuo; D. Chen; C. S. Yeh; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T08:18:06Z |
Gate tunneling leakage current behavior of 40 nm PD SOI NMOS device considering the floating body effect
|
H. J. Hung;J. B. Kuo;D. Chen;C. S. Yeh; H. J. Hung; J. B. Kuo; D. Chen; C. S. Yeh; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T08:18:06Z |
Gate tunneling leakage current behavior of 40 nm PD SOI NMOS device considering the floating body effect
|
H. J. Hung;J. B. Kuo;D. Chen;C. S. Yeh; H. J. Hung; J. B. Kuo; D. Chen; C. S. Yeh; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T08:18:06Z |
Modeling the Floating-Body-Effect-Induced Drain Current Behavior of 40nm PD SOI NMOS Device Via SPICE BJT/MOS Model Approach
|
J. S. Su;J. B. Kuo;D. Chen;C. S. Yeh; J. S. Su; J. B. Kuo; D. Chen; C. S. Yeh; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T08:18:06Z |
Modeling the Floating-Body-Effect-Induced Drain Current Behavior of 40nm PD SOI NMOS Device Via SPICE BJT/MOS Model Approach
|
J. S. Su;J. B. Kuo;D. Chen;C. S. Yeh; J. S. Su; J. B. Kuo; D. Chen; C. S. Yeh; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T08:18:06Z |
Low-Voltage SOI CMOS DTMOS/MTCMOS Circuit Technique for Design Optimization of Low-power SOC Applications
|
W.C.H. Lin;J. B. Kuo; W.C.H. Lin; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T08:18:06Z |
Low-Voltage SOI CMOS DTMOS/MTCMOS Circuit Technique for Design Optimization of Low-power SOC Applications
|
W.C.H. Lin;J. B. Kuo; W.C.H. Lin; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T08:18:06Z |
Modeling the parasitic bipolar device in the 40nm PD SOI NMOS device considering the floating body effect
|
C. H. Chen;J. B. Kuo;D. Chen;C. S. Yeh; C. H. Chen; J. B. Kuo; D. Chen; C. S. Yeh; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T08:18:06Z |
Modeling the parasitic bipolar device in the 40nm PD SOI NMOS device considering the floating body effect
|
C. H. Chen;J. B. Kuo;D. Chen;C. S. Yeh; C. H. Chen; J. B. Kuo; D. Chen; C. S. Yeh; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T08:18:06Z |
Charge Pumping Behavior of STI-Isolated PD SOI NMOS Device Operating at Low Temp
|
C. F. Yen;J. B. Kuo; C. F. Yen; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T08:18:06Z |
Charge Pumping Behavior of STI-Isolated PD SOI NMOS Device Operating at Low Temp
|
C. F. Yen;J. B. Kuo; C. F. Yen; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T08:18:05Z |
Shallow trench isolation-related narrow channel effect on the kink behaviour of 40 nm PD SOI NMOS device
|
H. J. Hung;J. B. kuo;D. Chen;C. T. Tsai;C. S. Yeh; H. J. Hung; J. B. kuo; D. Chen; C. T. Tsai; C. S. Yeh; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T08:18:05Z |
Shallow trench isolation-related narrow channel effect on the kink behaviour of 40 nm PD SOI NMOS device
|
H. J. Hung;J. B. kuo;D. Chen;C. T. Tsai;C. S. Yeh; H. J. Hung; J. B. kuo; D. Chen; C. T. Tsai; C. S. Yeh; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T07:41:38Z |
Compact Modelign of Nanometer SOI CMOS Devices Considering Shallow Trench Isolation
|
J. B. Kuo; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T07:41:38Z |
Compact Modelign of Nanometer SOI CMOS Devices Considering Shallow Trench Isolation
|
J. B. Kuo; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T07:41:38Z |
Floating-Body-Effect-Related Gate Tunneling Leakage Current Phenomenon of 40nm PD SOI NMOS Device
|
H. J. Hung;J. B. Kuo;C. T. Tsai;D. Chen; H. J. Hung; J. B. Kuo; C. T. Tsai; D. Chen; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T07:41:38Z |
Floating-Body-Effect-Related Gate Tunneling Leakage Current Phenomenon of 40nm PD SOI NMOS Device
|
H. J. Hung;J. B. Kuo;C. T. Tsai;D. Chen; H. J. Hung; J. B. Kuo; C. T. Tsai; D. Chen; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T07:41:38Z |
Low-Voltage CMOS VLSI Circuits
|
J. B. Kuo; J. H. Lou; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T07:41:37Z |
Shallow Trench Isolated-Related Narrow Channel Effect on Kink Effect and Breakdown Behavior of 40nm PD SOI NMOS Device
|
J. I. Lu;H. J. Hung;J. B. Kuo;D. Chen;C. S. Yeh;C. T. Tsai; J. I. Lu; H. J. Hung; J. B. Kuo; D. Chen; C. S. Yeh; C. T. Tsai; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T07:41:37Z |
Shallow Trench Isolated-Related Narrow Channel Effect on Kink Effect and Breakdown Behavior of 40nm PD SOI NMOS Device
|
J. I. Lu;H. J. Hung;J. B. Kuo;D. Chen;C. S. Yeh;C. T. Tsai; J. I. Lu; H. J. Hung; J. B. Kuo; D. Chen; C. S. Yeh; C. T. Tsai; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T07:41:37Z |
Floating-body-effect-related gate tunneling leakage current phenomenon of 40nm PD SOI NMOS device
|
H. J. Hung;J. I. Lu;J. B. Kuo;D. Chen;C. S. Yeh; H. J. Hung; J. I. Lu; J. B. Kuo; D. Chen; C. S. Yeh; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T07:41:37Z |
Floating-body-effect-related gate tunneling leakage current phenomenon of 40nm PD SOI NMOS device
|
H. J. Hung;J. I. Lu;J. B. Kuo;D. Chen;C. S. Yeh; H. J. Hung; J. I. Lu; J. B. Kuo; D. Chen; C. S. Yeh; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T07:41:37Z |
0.5V SOI CMOS Dual-Threshold Circuit Technique Via DTMOS for Design Optimization of Low-Power VLSI System Applications
|
W. J. H. Lin;C. Y. Chien;J. B. Kuo; W. J. H. Lin; C. Y. Chien; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T07:41:37Z |
0.5V SOI CMOS Dual-Threshold Circuit Technique Via DTMOS for Design Optimization of Low-Power VLSI System Applications
|
W. J. H. Lin;C. Y. Chien;J. B. Kuo; W. J. H. Lin; C. Y. Chien; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T07:41:37Z |
Design Optimization of Low-Power 90nm CMOS SOC Applications Using 0.5V Bulk PMOS Dynamic-Threshold with Dual Threshold (MTCMOS) BP-DTMOS-DT Technique
|
C. H. Lin;J. B. Kuo; C. H. Lin; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T07:41:37Z |
Design Optimization of Low-Power 90nm CMOS SOC Applications Using 0.5V Bulk PMOS Dynamic-Threshold with Dual Threshold (MTCMOS) BP-DTMOS-DT Technique
|
C. H. Lin;J. B. Kuo; C. H. Lin; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T07:41:37Z |
Modeling the Floating-Body-Effect-Induced Drain Current Behavior of PD SOI NMOS Device Via SPICE BJT/MOS Model Approach
|
J. S. Su;J. B. Kuo; J. S. Su; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T07:41:37Z |
Modeling the Floating-Body-Effect-Induced Drain Current Behavior of PD SOI NMOS Device Via SPICE BJT/MOS Model Approach
|
J. S. Su;J. B. Kuo; J. S. Su; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T07:41:37Z |
Gate Tunneling Leakage Current Behavior of 40nm PD SOI NMOS Device Considerign the Floating Body Effect
|
H. J. Hung;J. B. Kuo;D. Chen;C. S. Yeh; H. J. Hung; J. B. Kuo; D. Chen; C. S. Yeh; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T07:41:37Z |
Gate Tunneling Leakage Current Behavior of 40nm PD SOI NMOS Device Considerign the Floating Body Effect
|
H. J. Hung;J. B. Kuo;D. Chen;C. S. Yeh; H. J. Hung; J. B. Kuo; D. Chen; C. S. Yeh; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T07:41:36Z |
Temperature-Dependent Kink Effect Model for Partially-Depleted SOI NMOS Devices
|
S. C Lin; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T07:41:36Z |
Bandgap Narrowing
|
J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T07:41:36Z |
Closed-Form Partitioned Gate Tunneling Current Model for NMOS Devices with an Ultra-thin Gate Oxide
|
C. H. Lin;J. B. Kuo; C. H. Lin; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T07:41:36Z |
Closed-Form Partitioned Gate Tunneling Current Model for NMOS Devices with an Ultra-thin Gate Oxide
|
C. H. Lin;J. B. Kuo; C. H. Lin; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T07:41:36Z |
Compact MOS/Bipolar Charge-Control Model of Partially-Depleted SOI CMOS Devices for VLSI Circuit Simulation---SOI-Technology (ST)-SPICE
|
J. B. Kuo; K. W. Su; S. C. Lin; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T07:41:36Z |
A Novel 0.7V Two-Port 6T SRAM Memory Cell Structure with Single-Bit-Line Simultaneous Read-and-Write Access (SBLSRWA) Capability using Partially Depleted SOI Dynamic-Threshold Technique
|
S. C. Liu; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T07:41:36Z |
Semiconductor R&D in Taiwan
|
J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T07:41:35Z |
A CMOS Semi-Static Latch Circuit without Charge Sharing and Leakage Current Problems
|
P. F. Lin; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T07:41:35Z |
A Low-Voltage Semi-Dynamic DCVSPG-Domino Logic Circuit
|
J. H. Lou; J. B. Kuo; JAMES-B KUO |
臺大學術典藏 |
2018-09-10T07:41:35Z |
Modeling of Deep-Submicron SOI CMOS VLSI Devices
|
J. B. Kuo; JAMES-B KUO |