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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
南台科技大學 1996-01 Two modeling techniques for CMOS Circuits to enhance test generation and fault simulation for bridging faults K. J. Lee; J. J. Tang; 唐經洲
南台科技大學 1995-05 An IDDQ fault model to facilitate the design of built-in current sensor (BICSs) B. D. Liu; J. J. Tang; K. J. Lee
南台科技大學 1994-08 Bulit-in intermediate voltage testing for CMOS circuits K. J. Lee; J. J. Tang
南台科技大學 1994-08 EDEn- An integrated mixed-mode IC design environment Y. M. Lin; M. C. Jiang; W. Y. Lin; W. T. Chen; M. C. Hsiao; J. J. Tang; M. J. Wu; W. H. Luo; H. T. Chung; J. H. Chen; S. C. Liau
南台科技大學 1994-01 Physical fault consideration of test pattern generation for large embeeded PLAs B. D. Liu; J. J. Tang; K. J. Lee
南台科技大學 1993-09 A real time IDDQ testing scheme using current conveyor technique J. J. Tang; K.J. Lee; B.D. Liu
南台科技大學 1993-09 Maximal fault diagnosis resolution for programmable logic array B. D. Liu; J. J. Tang; K. J. Lee
南台科技大學 1993-09 An efficient algorithm to obtain both bipartite row and column folding results of a PLA. K. C. Wei; B. D. Liu; J. J. Tang
南台科技大學 1993-08 A new current sensing technique for IDDQ testing J. J. Tang; K. J. Lee; B. D. Liu

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