|
English
|
正體中文
|
简体中文
|
總筆數 :2856640
|
|
造訪人次 :
53523022
線上人數 :
840
教育部委託研究計畫 計畫執行:國立臺灣大學圖書館
|
|
|
"jakey blue"的相關文件
顯示項目 26-33 / 33 (共4頁)
<< < 1 2 3 4 > >>
每頁顯示[10|25|50]項目
| 臺大學術典藏 |
2020-03-02T06:40:07Z |
Impact of integrating equipment health in production scheduling for semiconductor fabrication
|
Kao, Y.-T.; Dauz?re-P?r?s, S.; Blue, J.; Chang, S.-C.; JAKEY BLUE |
| 臺大學術典藏 |
2020-03-02T06:40:06Z |
The detection and the control of machine/chamber mismatching in semiconductormanufacturing
|
Chouichi, A.; Blue, J.; Yugma, C.; Pasqualini, F.; JAKEY BLUE |
| 臺大學術典藏 |
2020-03-02T06:40:06Z |
Virtual metrology modeling based on Gaussian Bayesian network
|
Yang, W.-T.; Blue, J.; Roussy, A.; Reis, M.S.; Pinaton, J.; JAKEY BLUE |
| 臺大學術典藏 |
2020-03-02T06:40:06Z |
Equipment Deterioration Modeling and Causes Diagnosis in Semiconductor Manufacturing
|
Rostami, H.; Blue, J.; Chen, A.; Yugma, C.; JAKEY BLUE |
| 臺大學術典藏 |
2019 |
A Structure Data-Driven Framework for Virtual Metrology Modeling
|
Wei-Ting Yang; JAKEY BLUE; Agnes Roussy; Jacques Pinaton; Marco S. Reis |
| 臺大學術典藏 |
2017 |
Equipment condition diagnosis and fault fingerprint extraction in semiconductor manufacturing
|
Rostami, H.; Blue, J.; Yugma, C.; JAKEY BLUE |
| 臺大學術典藏 |
2013 |
Tool condition diagnosis with a recipe-independent hierarchical monitoring scheme
|
Blue, J.; Gleispach, D.; Roussy, A.; Scheibelhofer, P.; JAKEY BLUE |
| 國立臺灣大學 |
2009-11 |
Recipe-independent Indicator for Tool Health Diagnosis and Predictive Maintenance
|
Chen, Argon; Jakey Blue |
顯示項目 26-33 / 33 (共4頁)
<< < 1 2 3 4 > >>
每頁顯示[10|25|50]項目
|
