臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

	English \| 正體中文 \| 简体中文 \| Total items :0
	Visitors : 53194399 Online Users : 1039 Project Commissioned by the Ministry of Education Project Executed by National Taiwan University Library

Scope

Adv. Search

Login

Administrator

臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

About TAIR
	About TAIR

Browse By
	Institution
	Author
	Title
	Date
	Statistics Chart
	Institution Facts
	Trend

News
	2019臺灣學術機構典藏研討會
	機構典藏系統RC7版本已發佈

Copyright
	Publisher & Journal Policy
	TAIR Copyright Conference Minutes

Related Links
	機構典藏計畫網站
	ROAR
	OpenDOAR
	SHERPA
	OAIster
	JAIRO
	Ira
	DSPACE
	RWWR
	臺大學術典藏NTU Scholars

"james c m li"

Return to Browse by Author
Sorting by Title	Sort by Date

Showing items 1-8 of 8 (1 Page(s) Totally)
1
View [10|25|50] records per page

Institution	Date	Title	Author
臺大學術典藏	2018-09-10T15:26:16Z	DR Scan: DR-scan: A Test Methodology for Dual-rail Asynchronous Circuit	Shih-An. Hsieh;Y.-H.Wang;K.Y. Huang;James C.M Li; Shih-An. Hsieh; Y.-H.Wang; K.Y. Huang; James C.M Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T15:26:16Z	DR Scan: DR-scan: A Test Methodology for Dual-rail Asynchronous Circuit	Shih-An. Hsieh;Y.-H.Wang;K.Y. Huang;James C.M Li; Shih-An. Hsieh; Y.-H.Wang; K.Y. Huang; James C.M Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:09:33Z	Diagnosis of Multiple Scan Chain Timing Faults	W.S. Chuang;James C.-M. Li; W.S. Chuang; James C.-M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:09:33Z	Diagnosis of Multiple Scan Chain Timing Faults	W.S. Chuang;James C.-M. Li; W.S. Chuang; James C.-M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:09:33Z	On Optimizing Fault Coverage, Pattern Count, and ATPG Run Time Using A Hybrid Single-Capture Scheme for Testing Scan Designs	Shianling Wu; Laung-Terng Wang; Zhigang Jiang; Jiayong Song; Boryau Sheu; Xiaoqing Wen; James C.-M. Li; Jiun-Lang Huang; Ravi Apte; CHIEN-MO LI
臺大學術典藏	2018-09-10T06:37:54Z	Design and Chip Implementation of the Segment Weighted Random BIST for Low Power Testing	Chun-Yi Lee; James C.-M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T06:37:54Z	Response Inversion Scan Cell (RISC): A Peak Capture Power Reduction Technique	Shyue-Tsong Shen; James C.-M. Li; CHIEN-MO LI; Bin-Chuan Bai; B.-H. Chen; Wei-Chuang Kao
臺大學術典藏	2005-01	A Two-level Test Data Compression and Test Time Reduction Technique for SOC	Yu-Te Liaw; James C.-M. Li; CHIEN-MO LI

Showing items 1-8 of 8 (1 Page(s) Totally)
1
View [10|25|50] records per page