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Showing items 1-19 of 19  (1 Page(s) Totally)
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Institution Date Title Author
臺大學術典藏 2018-09-10T15:00:42Z Divide and Conquer Diagnosis for Multiple Defects SM Chao;PJ Chen;JCM Li; SM Chao; PJ Chen; JCM Li; CHIEN-MO LI
臺大學術典藏 2018-09-10T15:00:42Z Divide and Conquer Diagnosis for Multiple Defects SM Chao;PJ Chen;JCM Li; SM Chao; PJ Chen; JCM Li; CHIEN-MO LI
臺大學術典藏 2018-09-10T09:50:54Z Test Pattern Modification for Average IR-drop Reduction WS Ding;HY Hsieh;JCM Li; WS Ding; HY Hsieh; JCM Li; CHIEN-MO LI
臺大學術典藏 2018-09-10T09:50:54Z Test Pattern Modification for Average IR-drop Reduction WS Ding;HY Hsieh;JCM Li; WS Ding; HY Hsieh; JCM Li; CHIEN-MO LI
臺大學術典藏 2018-09-10T09:50:54Z Fault Simulation and Test Pattern Selection for Small Delay Defect Using GPU SC Hsu;KY Liao;JCM Li; SC Hsu; KY Liao; JCM Li; CHIEN-MO LI
臺大學術典藏 2018-09-10T09:50:54Z Fault Simulation and Test Pattern Selection for Small Delay Defect Using GPU SC Hsu;KY Liao;JCM Li; SC Hsu; KY Liao; JCM Li; CHIEN-MO LI
臺大學術典藏 2018-09-10T09:50:54Z Back-End-of-Line Defect Analysis for Rnv8T Nonvolatile SRAM BC Bai;C-L Hsu;MH Wu;CA Chen;YW Chen;KL Luo;LC Cheng;JCM Li; BC Bai; C-L Hsu; MH Wu; CA Chen; YW Chen; KL Luo; LC Cheng; JCM Li; CHIEN-MO LI
臺大學術典藏 2018-09-10T09:50:54Z Back-End-of-Line Defect Analysis for Rnv8T Nonvolatile SRAM BC Bai;C-L Hsu;MH Wu;CA Chen;YW Chen;KL Luo;LC Cheng;JCM Li; BC Bai; C-L Hsu; MH Wu; CA Chen; YW Chen; KL Luo; LC Cheng; JCM Li; CHIEN-MO LI
臺大學術典藏 2018-09-10T09:25:32Z Transient IR-drop Analysis for At-speed Testing Using Representative Random Walk MH Tsai;WS Ting;JCM Li; MH Tsai; WS Ting; JCM Li; CHIEN-MO LI
臺大學術典藏 2018-09-10T09:25:32Z Transient IR-drop Analysis for At-speed Testing Using Representative Random Walk MH Tsai;WS Ting;JCM Li; MH Tsai; WS Ting; JCM Li; CHIEN-MO LI
臺大學術典藏 2018-09-10T09:25:32Z Flexible TFT Circuit Analyzer Considering Process Variation, Aging, and Bending Effects EH Ma;WE Wei;JCM Li; EH Ma; WE Wei; JCM Li; CHIEN-MO LI
臺大學術典藏 2018-09-10T09:25:32Z Flexible TFT Circuit Analyzer Considering Process Variation, Aging, and Bending Effects EH Ma;WE Wei;JCM Li; EH Ma; WE Wei; JCM Li; CHIEN-MO LI
臺大學術典藏 2018-09-10T09:25:32Z 3D IC test scheduling using simulated annealing CY Hsu;CY Kuo;JCM Li;K. Chakrbarty; CY Hsu; CY Kuo; JCM Li; K. Chakrbarty; CHIEN-MO LI
臺大學術典藏 2018-09-10T09:25:32Z 3D IC test scheduling using simulated annealing CY Hsu;CY Kuo;JCM Li;K. Chakrbarty; CY Hsu; CY Kuo; JCM Li; K. Chakrbarty; CHIEN-MO LI
臺大學術典藏 2018-09-10T09:25:32Z GPU-Based Massively Parallel N-Detect Transition Delay Fault ATPG KY Liao;SC Hsu;JCM Li; KY Liao; SC Hsu; JCM Li; CHIEN-MO LI
臺大學術典藏 2018-09-10T09:25:32Z GPU-Based Massively Parallel N-Detect Transition Delay Fault ATPG KY Liao;SC Hsu;JCM Li; KY Liao; SC Hsu; JCM Li; CHIEN-MO LI
臺大學術典藏 2018-09-10T08:47:25Z Thermal-aware Test scheduling for 3D ICs CY Hsu; JCM Li; K. Chakrbarty; CHIEN-MO LI
臺大學術典藏 2018-09-10T08:19:10Z Row-LFSR-Column (RLC) Test Response Masking Technique WC Wang;JCM Li; WC Wang; JCM Li; CHIEN-MO LI
臺大學術典藏 2018-09-10T08:19:10Z Row-LFSR-Column (RLC) Test Response Masking Technique WC Wang;JCM Li; WC Wang; JCM Li; CHIEN-MO LI

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