臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Institution	Date	Title	Author
臺大學術典藏	2018-09-10T15:00:42Z	Divide and Conquer Diagnosis for Multiple Defects	SM Chao;PJ Chen;JCM Li; SM Chao; PJ Chen; JCM Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T15:00:42Z	Divide and Conquer Diagnosis for Multiple Defects	SM Chao;PJ Chen;JCM Li; SM Chao; PJ Chen; JCM Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T09:50:54Z	Test Pattern Modification for Average IR-drop Reduction	WS Ding;HY Hsieh;JCM Li; WS Ding; HY Hsieh; JCM Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T09:50:54Z	Test Pattern Modification for Average IR-drop Reduction	WS Ding;HY Hsieh;JCM Li; WS Ding; HY Hsieh; JCM Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T09:50:54Z	Fault Simulation and Test Pattern Selection for Small Delay Defect Using GPU	SC Hsu;KY Liao;JCM Li; SC Hsu; KY Liao; JCM Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T09:50:54Z	Fault Simulation and Test Pattern Selection for Small Delay Defect Using GPU	SC Hsu;KY Liao;JCM Li; SC Hsu; KY Liao; JCM Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T09:50:54Z	Back-End-of-Line Defect Analysis for Rnv8T Nonvolatile SRAM	BC Bai;C-L Hsu;MH Wu;CA Chen;YW Chen;KL Luo;LC Cheng;JCM Li; BC Bai; C-L Hsu; MH Wu; CA Chen; YW Chen; KL Luo; LC Cheng; JCM Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T09:50:54Z	Back-End-of-Line Defect Analysis for Rnv8T Nonvolatile SRAM	BC Bai;C-L Hsu;MH Wu;CA Chen;YW Chen;KL Luo;LC Cheng;JCM Li; BC Bai; C-L Hsu; MH Wu; CA Chen; YW Chen; KL Luo; LC Cheng; JCM Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T09:25:32Z	Transient IR-drop Analysis for At-speed Testing Using Representative Random Walk	MH Tsai;WS Ting;JCM Li; MH Tsai; WS Ting; JCM Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T09:25:32Z	Transient IR-drop Analysis for At-speed Testing Using Representative Random Walk	MH Tsai;WS Ting;JCM Li; MH Tsai; WS Ting; JCM Li; CHIEN-MO LI

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