臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Institution	Date	Title	Author
國立交通大學	2014-12-12T01:13:51Z	浮停閘極快閃記憶體之可靠度改善	黃國洲; Guo-Zhou Huang; 羅正忠; Jen-Chung Lou
國立交通大學	2014-12-12T01:13:50Z	含氮氧化層應用於二氧化鉿儲存層快閃記憶體資料儲存時間之改善	鄭元愷; 羅正忠; Jen-Chung Lou
國立交通大學	2014-12-12T01:13:50Z	含氮穿隧氧化層再氧化行為於氮化矽快閃式記憶體之特性與研究	洪晨修; Chen-Hsiu Hung; 羅正忠; Jen-Chung Lou
國立交通大學	2014-12-12T01:13:44Z	超薄含氮氧化層創新製程技術應用在p型金氧半場效電晶體之特性研究	葉佳樺; Chia-Hua Yeh; 羅正忠; Jen-Chung Lou
國立交通大學	2014-12-12T01:13:20Z	溝渠式橫向金氧半場效電晶體分析與最佳化設計之研究	林宏春; Hung-Chun Lin; 羅正忠; Jen-Chung Lou
國立高雄師範大學	2013-11-21	High performance of graphene oxide-doped silicon oxide-based resistance random access memory	陳榮輝; Rong-Huei Chen;Rui Zhang;Kuan-Chang Chang;Ting-Chang Chang;Tsung-Ming Tsai;Kai-Huang Chen;Jen-Chung Lou;Tai-Fa Young;Chih-Cheng Shih;Ya-Liang Yang;Yin-Chih Pan;Tian-Jian Chu;Syuan-Yong Huang;Chih-Hung Pan;Yu-Ting Su;Yong-En Syu;Simon M Sze
國立高雄師範大學	2013-07	Endurance Improvement Technology With Nitrogen Implanted in the Interface of WSiOx Resistance Switching Device	陳榮輝; Rong-Huei Chen;Yong-En Syu;Rui Zhang;Ting-Chang Chang;Tsung-Ming Tsai;Kuan-Chang Chang;Jen-Chung Lou;Tai-Fa Young;Min-Chen Chen;Ya-Liang Yang;Chih-Cheng Shih;Tian-Jian Chu;Jian-Yu Chen;Chih-Hung Pan;Yu-Ting Su;Hui-Chun Huang;Der-Shin Gan;Simon M. Sze
國立高雄師範大學	2013-05	The effect of high/low permittivity in bilayer HfO2/BN resistance random access memory	陳榮輝; Rong-Huei Chen;Jen-Wei Huang;Rui Zhang;Ting-Chang Chang;Tsung-Ming Tsai;Kuan-Chang Chang;Jen-Chung Lou;Tai-Fa Young;Jung-Hui Chen;Hsin-Lu Chen;Yin-Chih Pan;Xuan Huang;Fengyan Zhang;Yong-En Syu;Simon M. Sze
國立高雄師範大學	2013-05	Hopping Effect of Hydrogen-Doped Silicon Oxide Insert RRAM by Supercritical CO2 Fluid Treatment	陳榮輝; Rong-Huei Chen;Kuan-Chang Chang;Chih-Hung Pan;Ting-Chang Chang;Tsung-Ming Tsai;Rui Zhang;Jen-Chung Lou;Tai-Fa Young;Chih-Cheng Shih;Tian-Jian Chu;Jian-Yu Chen;Yu-Ting Su;Jhao-Ping Jiang;Kai-Huang Chen;Hui-Chun Huang;Yong-En Syu;Der-Shin Gan;Simon M. Sze
國立高雄師範大學	2013-05	Origin of Hopping Conduction in Graphene Oxide-Doped Silicon Oxide Resistance Random Access Memory Devices	陳榮輝; Rong-Huei Chen;Kuan-Chang Chang;Rui Zhang;Ting-Chang Chang;Tsung-Ming Tsai;Jen-Chung Lou;Tai-Fa Young;Min-Chen Chen;Ya-Liang Yang;Yin-Chih Pan;Geng-Wei Chang;Tian-Jian Chu;Chih-Cheng Shih;Jian-Yu Chen;Chih-Hung Pan;Yu-Ting Su;Yong-En Syu;Ya-Hsiang Tai;Simon M. Sze
國立高雄師範大學	2013-04	Hopping conduction distance dependent activation energy characteristics of Zn:SiO2 resistance random access memory devices	陳榮輝; Rong-Huei Chen;Kai-Huang Chen;Rui Zhang;Ting-Chang Chang;Tsung-Ming Tsai;Kuan-Chang Chang;Jen-Chung Lou;Tai-Fa Young; Chih-Cheng Shih;Cheng-Wei Tung;Yong-En Syu;Simon M. Sze

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