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Institution Date Title Author
國立交通大學 2014-12-08T15:04:35Z A STUDY OF LATCH-UP HYSTERESIS IN N-WELL CMOS BY MEANS OF I-V-CHARACTERISTICS AND PHOTOEMISSION TECHNIQUES CHEN, MJ; JENG, JK
國立交通大學 2014-12-08T15:02:13Z Low-temperature characteristics of well-type guard rings in epitaxial CMOS Huang, CY; Chen, MJ; Jeng, JK; Wu, CY

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