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Institution Date Title Author
東海大學 2010 A small/wide-angle X-ray scattering instrument for structural characterization of air-liquid interfaces, thin films and bulk specimens Jeng, U.-S. , Su, C.H., Su, C.-J., Liao, K.-F., Chuang, W.-T., Lai, Y.-H., Chang, J.-W., Chen, Y.-J., Huang, Y.-S., Lee, M.-T., Yu, K.-L., Lin, J.-M., Liu, D.-G., Chang, C.-F., Liu, C.-Y., Chang, C.-H., Liang, K.S.
東海大學 2010 A small/wide-angle X-ray scattering instrument for structural characterization of air-liquid interfaces, thin films and bulk specimens Jeng, U.-S. , Su, C.H., Su, C.-J., Liao, K.-F., Chuang, W.-T., Lai, Y.-H., Chang, J.-W., Chen, Y.-J., Huang, Y.-S., Lee, M.-T., Yu, K.-L., Lin, J.-M., Liu, D.-G., Chang, C.-F., Liu, C.-Y., Chang, C.-H., Liang, K.S.
東海大學 2010 A small/wide-angle X-ray scattering instrument for structural characterization of air-liquid interfaces, thin films and bulk specimens Jeng, U.-S. , Su, C.H., Su, C.-J., Liao, K.-F., Chuang, W.-T., Lai, Y.-H., Chang, J.-W., Chen, Y.-J., Huang, Y.-S., Lee, M.-T., Yu, K.-L., Lin, J.-M., Liu, D.-G., Chang, C.-F., Liu, C.-Y., Chang, C.-H., Liang, K.S.

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