臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Institution	Date	Title	Author
國立交通大學	2014-12-08T15:42:37Z	An on-chip test structure and digital measurement method for statistical characterization of local random variability in a process	Mukhopadhyay, Saibal; Kim, Keunwoo; Jenkins, Keith A.; Chuang, Ching-Te; Roy, Kaushik

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