臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Showing items 116-119 of 119 (3 Page(s) Totally)
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Institution	Date	Title	Author
國立高雄師範大學	2000	Enhancement in Soft Breakdown Occurrence on Ultra-thin Gate Oxides Caused by Photon Effect in Rapid Thermal Post Oxidation Annealing	Chia-Hong Huang;Jenn-Gwo Hwu; 黃嘉宏
國立高雄師範大學	2000	Role of Interface Trap Generation in the Low-Voltage Tunneling Current ( LVTC ) Characteristics of Ultra-Thin Gate Oxide ( ~2nm ) under High Field Stress	Chia-Hong Huang;Jenn-Gwo Hwu; 黃嘉宏
國立高雄師範大學	1999	The Breakdown Properties of Front- and Back-side Post Oxidation Annealed( POA ) Ultrathin Gate Oxide ( <3nm ) under High Field Stress	Chia-Hong Huang;Jenn-Gwo Hwu; 黃嘉宏
臺大學術典藏	1996	Reliable fluorinated thin gate oxides prepared by liquid phase deposition following rapid thermal process	JENN-GWO HWU; Hwu, J.-G.; Lu, W.-S.; Lu, W.-S.;Hwu, J.-G.

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